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LF351 Datasheet (PDF) - STMicroelectronics

LF351 Datasheet PDF - STMicroelectronics
Part # LF351_08
Download  LF351 Download

File Size   622.28 Kbytes
Page   14 Pages
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics
Description Wide bandwidth single JFET operational amplifiers

LF351 Datasheet (PDF)

Go To PDF Page Download Datasheet
LF351 Datasheet PDF - STMicroelectronics

Part # LF351_08
Download  LF351 Click to download

File Size   622.28 Kbytes
Page   14 Pages
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics
Description Wide bandwidth single JFET operational amplifiers

LF351 Datasheet (HTML) - STMicroelectronics

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LF351 Product details

Description
These circuits are high speed JFET input single operational amplifiers incorporating well matched, high voltage JFET and bipolar transistors in a monolithic integrated circuit.
The devices feature high slew rates, low input bias and offset currents, and low offset voltage temperature coefficient.

Features
■ Internally adjustable input offset voltage
■ Low power consumption
■ Wide common-mode (up to VCC+) and differential voltage range
■ Low input bias and offset current
■ Output short-circuit protection
■ High input impedance JFET input stage
■ Internal frequency compensation
■ Latch up free operation
■ High slew rate 16 V/µs (typical)




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About STMicroelectronics


STMicroelectronics is a multinational electronics and semiconductor manufacturer based in Geneva, Switzerland.

The company offers a wide range of products including microcontrollers, sensors, power amplifiers, and integrated circuits for various applications in the automotive, industrial, and consumer markets.

Founded in 1987, STMicroelectronics has operations in over 100 countries and is one of the largest semiconductor companies in the world.

*This information is for general informational purposes only, we will not be liable for any loss or damage caused by the above information.




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