Manufacturer | Part # | Datasheet | Description |
Analog Devices |
AN-756
|
298Kb / 12P |
Sampled Systems and the Effects of Clock Phase Noise and Jitter
REV. 0 |
GSI Technology |
GS8662QT10BD-250I
|
501Kb / 28P |
Byte Write controls sampled at data-in time
|
GS8662Q07BGD-250
|
502Kb / 28P |
Byte Write controls sampled at data-in time
|
GS8342Q07BGD-300
|
502Kb / 28P |
Byte Write controls sampled at data-in time
|
GS81302DT07E-300
|
513Kb / 30P |
Byte Write controls sampled at data-in time
|
GS82582Q38GE-500
|
436Kb / 25P |
Byte Write controls sampled at data-in time
|
Exar Corporation |
XRDAN28
|
122Kb / 4P |
Frequency Response Effects of Overampling and Averaging on A/D Output Data
|
STMicroelectronics |
AN2352
|
188Kb / 20P |
PLL jitter effects on C-CAN modules of the ST10F27x
|
Analog Devices |
MT-002
|
158Kb / 12P |
What the Nyquist Criterion Means to Your Sampled Data System Design
Rev.A, 10/08, WK |
Keysight Technologies |
JS-1500
|
165Kb / 4P |
In-depth jitter characterization of clock and data devices from 50 kHz to 20 GHz
|