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104595 Datasheet(PDF) 37 Page - PHOENIX CONTACT |
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104595 Datasheet(HTML) 37 Page - PHOENIX CONTACT |
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37 / 41 page  Appendix - Safety-related applications (SIL 2) en Version 04 PHOENIX CONTACT A-3 1.2.2 Failure rates: MACX MCR(-EX)-T-UIREL-UP (-SP)(-C) – Type B device (according to EN 61508-2) – Safety Integrity Level (SIL) 2 –HFT = 0 – 1oo1d architecture The total failure rate is: 1.34 * 10 -6 The MTBF (Mean Time Between Failures) is therefore 85 years. The probability of a dangerous failure per hour for “continu- ous demand” mode and the average probability of failure of the specified function for “low demand” mode are deter- mined from the error rate: PFD avg values PFH* = 5.6 * 10 -8 /h The calculation is performed assuming a checking interval (T PROOF) of 1 year and a repair time (MTTR) of 24 hours, a test coverage (CPT) of 95% and a life time (LT) of 10 years. On the basis of the value determined for the average proba- bility of failure PFD avg, the checking interval can be in- creased to up to 5 yearsif the percentage of the device for the entire loop is assumed at 10%. The values are valid under the following conditions: – The failure rates of the components used remain con- stant throughout the period of use. – The propagation of failures by the device in the system is not taken into consideration. – The repair time (replacement) is eight hours. – The failure rates of the external power supply unit are not taken into consideration. – The average temperature at which the device is to be used is 40°C. In this case, normal industrial conditions are assumed. – The specified failure rates are based on an average am- bient temperature of 40°C. For an average ambient temperature of 60°C, the failure rates must be multiplied by factor 2.5. Factor 2.5 is based on guide values. 1.2.3 Failure rates: MACX MCR(-EX)-T-UI-UP(-SP) (-C) – Type B device (according to EN 61508-2) – Safety Integrity Level (SIL) 2 –HFT = 0 – 1oo1d architecture The total failure rate is: 1.18 * 10 -6 The MTBF (Mean Time Between Failures) is therefore 97 years. The probability of a dangerous failure per hour for “continu- ous demand” mode and the average probability of failure of the specified function for “low demand” mode are deter- mined from the error rate: PFD avg values PFH* = 4.3 * 10 -8 /h The calculation is performed assuming a checking interval (T PROOF) of 1 year and a repair time (MTTR) of 24 hours, a test coverage (CPT) of 95% and a life time (LT) of 10 years. On the basis of the value determined for the average proba- bility of failure PFD avg, the checking interval can be in- creased to up to 5 years. The values are valid under the following conditions: – The failure rates of the components used remain con- stant throughout the period of use. – The propagation of failures by the device in the system is not taken into consideration. Input: Voltage input mV Output: Switching output 2 and 3 (redundant) λ SD λ SU λ DD λ DU SFF DC D 0 2.38 * 10 -7 5.22* 10 -7 0.56 * 10 -7 93% 90% 0 FIT 238 FIT 522 FIT 56 FIT T[PROOF] = 1 year 2 years 5 years PFD avg = 3.67 * 10 -4 5.99 * 10 -4 1.30 * 10 -3 Input: RTD 3-wire connection method Output: 4 ... 20 mA (current output) λ SD λ SU λ DD λ DU SFF DC D 0 0 8.05* 10 -7 0.43 * 10 -7 94% 94% 0 FIT 0 FIT 805 FIT 43 FIT T[PROOF] = 1 year 2 years 5 years PFD avg = 2.95 * 10 -4 4.76 * 10 -4 1.02 * 10 -3 |
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