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104595 Datasheet(PDF) 38 Page - PHOENIX CONTACT |
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104595 Datasheet(HTML) 38 Page - PHOENIX CONTACT |
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38 / 41 page  Appendix - Safety-related applications (SIL 2) en Version 04 PHOENIX CONTACT A-4 – The repair time (replacement) is eight hours. – The failure rates of the external power supply unit are not taken into consideration. – The average temperature at which the device is to be used is 40°C. In this case, normal industrial conditions are assumed. – The specified failure rates are based on an average am- bient temperature of 40°C. For an average ambient temperature of 60°C, the failure rates must be multiplied by factor 2.5. Factor 2.5 is based on guide values. 1.2.4 Failure rates: MACX MCR(-EX)-T-UI-UP(-SP) (-C) – Type B device (according to EN 61508-2) – Safety Integrity Level (SIL) 2 –HFT = 0 – 1oo1d architecture The total failure rate is: 1.19 * 10 -6 The MTBF (Mean Time Between Failures) is therefore 96 years. The probability of a dangerous failure per hour for “continu- ous demand” mode and the average probability of failure of the specified function for “low demand” mode are deter- mined from the error rate: PFD avg values PFH* = 5.6 * 10 -8 /h The calculation is performed assuming a checking interval (T PROOF) of 1 year and a repair time (MTTR) of 24 hours, a test coverage (CPT) of 95% and a life time (LT) of 10 years. On the basis of the value determined for the average proba- bility of failure PFD avg, the checking interval can be in- creased to up to 5 years. The values are valid under the following conditions: – The failure rates of the components used remain con- stant throughout the period of use. – The propagation of failures by the device in the system is not taken into consideration. – The repair time (replacement) is eight hours. – The failure rates of the external power supply unit are not taken into consideration. – The average temperature at which the device is to be used is 40°C. In this case, normal industrial conditions are assumed. – The specified failure rates are based on an average am- bient temperature of 40°C. For an average ambient temperature of 60°C, the failure rates must be multiplied by factor 2.5. Factor 2.5 is based on guide values. A1.3 Configuring an SIL device The measuring transducer can be ordered with a standard configuration (see 1.) or configured for safety-related appli- cations (see 2.), or can be configured by users themselves for safety-related applications (see 3.). 1. The measuring transducers are delivered with a stan- dard configuration for safety-related applications with a 4 - 20 mA output (see order key). 2. Customer-specific pre-configured devices (-C) can be delivered for both safety-related applications and “nor- mal” usage. Configuration data is shown on a label. 3. The measuring transducers can also be configured by users for both safety-related applications and “normal” usage. The configuration can be read out and changed at any time for all devices. Input: Voltage input mV Output: 4 ... 20 mA (current output) λ SD λ SU λ DD λ DU SFF DC D 0 0 7.89* 10 -7 0.56 * 10 -7 93% 93% 0 FIT 0 FIT 789 FIT 56 FIT T[PROOF] = 1 year 2 years 5 years PFD avg = 3.75 * 10 -4 6.08 * 10 -4 1.31 * 10 -3 For safety-related applications, the password set in the factory must always be changed. If the password is lost, it is not possible to change the configuration. In this case, please contact Phoenix Contact. |
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