5

LM2904-Q1, LM2904B-Q1

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SLOS414G – MAY 2003 – REVISED FEBRAURY 2019

Product Folder Links: LM2904-Q1 LM2904B-Q1

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Copyright © 2003–2019, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Differential voltages are at IN+, with respect to IN

−.

(3)

Short circuits from outputs to the supply pins can cause excessive heating and eventual destruction.

7 Specifications

7.1 Absolute Maximum Ratings

over operating ambient temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

LM2904B-Q1, LM2904BA-Q1

40

V

LM2904V-Q1, LM2904AV-Q1

32

LM2904-Q1

26

(2)

LM2904B-Q1, LM2904BA-Q1,

LM2904V-Q1, LM2904AV-Q1

–32

32

V

LM2904-Q1

–26

26

Either input

LM2904B-Q1, LM2904BA-Q1

–0.3

40

V

LM2904V-Q1, LM2904AV-Q1

–0.3

32

LM2904-Q1

–0.3

26

(3)

Unlimited

s

–40

125

°C

150

°C

–65

150

°C

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

7.2 ESD Ratings

VALUE

UNIT

LM2904B-Q1, AND LM2904BA-Q1

Electrostatic discharge

±2000

V

Charged-device model (CDM), per AEC Q100-011

±750

LM2904-Q1, LM2904AV-Q1, AND LM2904V-Q1

Electrostatic discharge

±1000

V

Charged-device model (CDM), per AEC Q100-011

±500