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ADIS16489 Datasheet(PDF) 39 Page - Analog Devices

Part # ADIS16489
Description  Seven Degrees of Freedom Inertial Sensor
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADIS16489 Datasheet(HTML) 39 Page - Analog Devices

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Data Sheet
ADIS16489
Rev. B | Page 39 of 40
0.4334 [11.0]
0.0240 [0.610]
0.019685
[0.5000]
(TYP)
0.054 [1.37]
0.0394 [1.00]
0.0394 [1.00]
0.1800
[4.57]
NONPLATED
THRU HOLE 2×
0.022±
DIA (TYP)
0.022 DIA THRU HOLE (TYP)
NONPLATED THRU HOLE
Figure 37. Suggested Layout and Mechanical Design When Using Samtec
CLM-112-02-G-D-A for the Mating Connector
EVALUATION TOOLS
Breakout Board, ADIS16IMU1/PCBZ
The ADIS16IMU1/PCBZ (sold separately) provides a breakout
board function for the ADIS16489, which means that it provides
access to the ADIS16489 through larger connectors that support
standard 1 mm ribbon cabling. It also provides four mounting
holes for attachment of the ADIS16489 to the breakout board.
PC-Based Evaluation, EVAL-ADIS2
The EVAL-ADIS2 provides the system support PC-based
evaluation of the ADIS16489.
POWER SUPPLY CONSIDERATIONS
The VDD power supply must charge 24 µF of capacitance (inside
of the ADIS16489, across the VDD and GND pins) during its
initial ramp and settling process. When VDD reaches 2.85 V,
the ADIS16489 begins its internal start-up process, which gener-
ates additional transient current demand. See Figure 38 for a
typical current profile during the start-up process. The first
peak in Figure 38 relates to charging the 24 µF capacitor bank,
whereas the second peak (~360 ms after the first peak) relates
to the initialization process of the ADIS16489. See Figure 39 for
a close view of the current profile associated with the second
peak in Figure 38.
CH1 2.00V
CH4 100mA Ω
100ms/DIV
1
4
T
VDD
CURRENT
Figure 38. Transient Current Demand, Startup
CH4 100mA Ω
1ms/DIV
4
T
CURRENT
Figure 39. Transient Current Demand, Peak Demand
X-RAY SENSITIVITY
Exposure to high dose rate X-rays, such as those in production
systems that inspect solder joints in electronic assemblies, can
affect accelerometer bias errors. For optimal performance,
avoid exposing the ADIS16489A to this type of inspection.


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