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ST72F262G2B6 Datasheet(PDF) 129 Page - STMicroelectronics

Part # ST72F262G2B6
Description  8-BIT MCU WITH FLASH OR ROM MEMORY, ADC, TWO 16-BIT TIMERS, I2C, SPI, SCI INTERFACES
PDF  172 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST72F262G2B6 Datasheet(HTML) 129 Page - STMicroelectronics

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OPERATING CONDITIONS (Cont’d)
13.3.2 Operating Conditions with Low Voltage Detector (LVD)
TA = -40 to +85°C unless otherwise specified
Notes:
1. Data based on characterization results, not tested in production.
2. When VtPOR is faster than 100 µs/V, the Reset signal is released after a delay of max. 42µs after VDD crosses the
VIT+(LVD) threshold.
3. Use of LVD with capacitive power supply: with this type of power supply, if power cuts occur in the application, it is
recommended to pull VDD down to 0V to ensure optimum restart conditions. Refer to circuit example in Figure 91 on page
151 and note 6.
.
Figure 65. LVD Startup Behaviour
Note: When the LVD is enabled, the MCU reaches its authorized operating voltage from a reset state.
However, in some devices, the reset signal may be undefined until VDD is approximately 2V. As a conse-
quence, the I/Os may toggle when VDD is below this voltage.
Because Flash write access is impossible below this voltage, the Flash memory contents will not be cor-
rupted.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIT+(LVD)
Reset release threshold
(VDD rise)
High Threshold
Med. Threshold
Low Threshold
4.0 1)
3.55 1)
2.95 1)
4.2
3.75
3.15
4.5
4.0
3.35
V
VIT-(LVD)
Reset generation threshold
(VDD fall)
High Threshold
Med. Threshold
Low Threshold
3.75
3.3
2.75
4.0
3.55
3.0
4.251)
3.751)
3.151)
Vhys(LVD)
LVD voltage threshold hysteresis
VIT+(LVD)-VIT-(LVD)
200
mV
VtPOR
VDD rise time rate
1)2)3)
Flash
20
µs/V
20ms/V
ROM
20
µs/V
∞
tg(VDD)
Filtered glitch delay on VDD
1)
Not detected by the LVD
40
ns
5V
2V
VIT+
LVD RESET
V D
D
t
Reset state
in this area
not defined



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