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HD6433635SW Datasheet(PDF) 131 Page - Renesas Technology Corp |
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HD6433635SW Datasheet(HTML) 131 Page - Renesas Technology Corp |
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131 / 418 page  117 6.4 Reliability of Programmed Data A highly effective way of assuring data retention characteristics after programming is to screen the chips by baking them at a temperature of 150 °C. This quickly eliminates PROM memory cells causing initial data retention failure. Figure 6.6 shows a flowchart of this screening procedure. Install Write program and verify contents Bake at high temperature with power off 125 °C to 150°C, 24 hrs to 48 hrs Read and check program Figure 6.6 Recommended Screening Procedure If write errors occur repeatedly while the same PROM programmer is being used, stop programming and check for problems in the PROM programmer and socket adapter, etc. Please notify your Hitachi representative of any problems occurring during programming or in screening after high-temperature baking. |
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