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BQ24313DSGR Datasheet(PDF) 12 Page - Texas Instruments |
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BQ24313DSGR Datasheet(HTML) 12 Page - Texas Instruments |
12 / 22 page Input Overvoltage Protection Input Overcurrent Protection Battery Overvoltage Protection Thermal Protection Enable Function Fault Indication bq24313 bq24315 SLUS817A – MARCH 2008 – REVISED NOVEMBER 2008............................................................................................................................................... www.ti.com While the input voltage is less than VO(REG), the output voltage tracks the input voltage (less the drop due to the RDS(on) of Q1). When the input voltage is between VO(REG) and VOVP, the device functions as a linear regulator and regulates the output voltage to 5.5V. If the input voltage rises above VOVP, the internal FET Q1 is turned off, removing power to the output. The response is rapid, with the FET turning off in less than a microsecond. The FAULT pin is driven low. When the input voltage returns below VOVP – Vhys(OVP) (but is still above UVLO), the FET Q1 is turned on again after a deglitch time of tON(OVP) to ensure that the input supply has stabilized. The overcurrent threshold is programmed by a resistor R(ILIM) connected from the ILIM pin to VSS. Figure 17 shows the OCP threshold as a function of R(ILIM), and may be approximated by the following equation: IOCP = 25 ÷ R(ILIM) (current in A, resistance in kΩ) If the load current tries to exceed the IOCP threshold, the device limits the current for a blanking duration of tBLANK(OCP). If the load current returns to less than IOCP before tBLANK(OCP) times out, the device continues to operate. However, if the overcurrent situation persists for tBLANK(OCP), the FET Q1 is turned off for a duration of tREC(OCP), and the FAULT pin is driven low. The FET is then turned on again after tREC(OCP) and the current is monitored all over again. Each time an OCP fault occurs, an internal counter is incremented. If 15 OCP faults occur in one charge cycle, the FET is turned off permanently. The counter is cleared either by removing and re-applying input power, or by disabling and re-enabling the device with the CE pin. To prevent the input voltage from spiking up due to the inductance of the input cable, Q1 is turned off slowly, resulting in a “soft-stop”. The battery overvoltage threshold BVOVP is internally set to 4.35V. If the battery voltage exceeds the BVOVP threshold, the FET Q1 is turned off, and the FAULT pin is driven low. The FET is turned back on once the battery voltage drops to BVOVP – Vhys(Bovp). Each time a battery overvoltage fault occurs, an internal counter is incremented. If 15 such faults occur in one charge cycle, the FET is turned off permanently. The counter is cleared either by removing and re-applying input power, or by disabling and re-enabling the device with the CE pin. For a battery overvoltage fault, Q1 is gradually switched OFF. If the junction temperature of the device exceeds TJ(OFF), the FET Q1 is turned off, and the FAULT pin is driven low. The FET is turned back on when the junction temperature falls below TJ(OFF) – TJ(OFF-HYS). The IC has an enable pin which can be used to enable or disable the device. When the CE pin is driven high, the internal FET is turned off. When the CE pin is low, the FET is turned on if other conditions are safe. The OCP counter and the Bat-OVP counter are both reset when the device is disabled and re-enabled. The CE pin has an internal pulldown resistor and can be left floating. Note that the FAULT pin functionality is also disabled when the CE pin is high. The FAULT pin is an active-low open-drain output. It is in a high-impedance state when operating conditions are safe, or when the device is disabled by setting CE high. With CE low, the FAULT pin goes low whenever any of these events occurs: • Input overvoltage • Input overcurrent • Battery overvoltage • IC Overtemperature 12 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): bq24313 bq24315 |
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