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AT42QT1111-MU Datasheet(PDF) 7 Page - ATMEL Corporation |
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AT42QT1111-MU Datasheet(HTML) 7 Page - ATMEL Corporation |
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7 / 50 page  7 9571A–AT42–02/10 AT42QT1111-MU/AT42QT1111-AU 2. Overview of the AT42QT1111 2.1 Introduction The AT42QT1111 (QT1111) is a digital burst mode charge-transfer (QT™) capacitive sensor driver designed for any touch-key applications. The keys can be constructed in different shapes and sizes. Refer to the Touch Sensors Design Guide and Application Note QTAN0002, Secrets of a Successful QTouch™ Design, for more information on construction and design methods (both downloadable from the Atmel ® website). The device includes all signal processing functions necessary to provide stable sensing under a wide variety of changing conditions, and the outputs are fully debounced. Only a few external parts are required for operation. The QT1111 modulates its bursts in a spread-spectrum fashion in order to suppress heavily the effects of external noise, and to suppress RF emissions. 2.2 Configurations The QT1111 is designed as a versatile device, capable of various configurations. There are two basic configurations for the QT1111: • 11-key QTouch. The device can sense up to 11 keys. • 7-key QTouch with individual outputs for each key. The device can sense up to 7 keys and drive the matching Detect outputs to a user-configurable PWM. Both configurations allow for a choice of acquisition modes, thus providing a variety of possibilities that will satisfy most applications (see the following sections for more information). Additionally, the SYNC line can be used as an external trigger input. Note that in 11-key mode the SYNC line replaces one key, thus allowing only 10 keys. See Section 4.7 on page 18 for more information. 2.3 Guard Channel The device has a guard channel option (available in all key modes), which allows one key to be configured as a guard channel to help prevent false detection. See Section 4.9 on page 19 for more information. 2.4 Self-test Functions The QT1111 has two types of self-test functions: • Internal Hardware tests – check for hardware failures in the device’s internal memory. • Functional checks – confirm that the device is operating within expected parameters. See Section 4.10 on page 20 for more information. |
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