ST72104GX datasheet(101/141 Pages) STMICROELECTRONICS

101 / 141 page

ST72104Gx, ST72215Gx, ST72216Gx, ST72254Gx

101/141

FUNCTIONAL OPERATING CONDITIONS (Cont’d)

Figure 56. High LVD Threshold Versus V

DD and f

OSC for ROM devices

Figure 57. Medium LVD Threshold Versus V

DD and f

OSC for ROM devices

Figure 58. Low LVD Threshold Versus V

DD and f

OSC for ROM devices

2)3)

Notes:

1. LVD typical data are based on TA=25°C. They are given only as design guidelines and are not tested.

2. The minimum VDD rise time rate is needed to insure a correct device power-on and LVD reset. Not tested in production.

3. If the low LVD threshold is selected, when VDD falls below 3.2V, the device is guaranteed to be either functioning or

under reset.

fOSC [MHz]

SUPPLY VOLTAGE [V]

2.5

3.5

4.5

5.5

FUNCTIONAL AREA

DEVICE UNDER

RESET

IN THIS AREA

FUNCTIONALITY

NOT GUARANTEED

IN THIS AREA

VIT-≥3.85

fOSC [MHz]

SUPPLY VOLTAGE [V]

2.5

VIT-≥3.5V

44.5

55.5

FUNCTIONAL AREA

DEVICE UNDER

RESET

IN THIS AREA

FUNCTIONALITY

NOT GUARANTEED

IN THIS AREA

fOSC [MHz]

SUPPLY VOLTAGE [V]

2.5

VIT-≥3.00V

3.5

4.5

5.5

FUNCTIONAL AREA

DEVICE UNDER

RESET

IN THIS AREA

FUNCTIONALITY

NOT GUARANTEED

IN THIS AREA

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