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VN5E025MJ-E Datasheet(PDF) 11 Page - STMicroelectronics |
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VN5E025MJ-E Datasheet(HTML) 11 Page - STMicroelectronics |
11 / 34 page ![]() DocID16373 Rev 2 11/35 VN5E025MJ-E Electrical specifications 33 ISENSE0 Analog sense leakage current IOUT = 0A; VSENSE = 0V; VCSD = 5V; VIN = 0V; Tj = -40°C...150°C 01 µA IOUT = 0A; VSENSE = 0V; VCSD = 0V; VIN = 5V; Tj = -40°C...150°C 02 µA IOUT = 2A; VSENSE = 0V; VCSD = 5V; VIN = 5V; Tj = -40°C...150°C 01 µA IOL Open load on-state current detection threshold VIN = 5V, 8V < VCC < 18V; ISENSE = 5 µA 530 mA VSENSE Max analog sense output voltage IOUT = 3A; VCSD = 0V 5 V VSENSEH (2) Analog sense output voltage in fault condition VCC = 13V; RSENSE = 3.9KΩ 8 ISENSEH (2) Analog sense output current in fault condition VCC = 13V; VSENSE = 5V 9 mA tDSENSE1H Delay response time from falling edge of CS_DIS pin VSENSE < 4V; 0.5 < IOUT < 10A; ISENSE = 90% of ISENSE max (see Figure 4) 40 100 µs tDSENSE1L Delay response time from rising edge of CS_DIS pin VSENSE < 4V; 0.5 < IOUT < 10A; ISENSE = 10% of ISENSE max (see Figure 4) 520 tDSENSE2H Delay response time from rising edge of INPUT pin VSENSE < 4V, 0.5 < IOUT < 10A; ISENSE = 90% of ISENSE max (see Figure 4) 80 300 ΔtDSENSE2H Delay response time between rising edge of output current and rising edge of current sense VSENSE < 4V; ISENSE = 90% of ISENSEMAX; IOUT = 90% of IOUTMAX; IOUTMAX = 3A (see Figure 7) 110 tDSENSE2L Delay response time from falling edge of INPUT pin VSENSE < 4V, 0.5 < IOUT < 10A; ISENSE = 10% of ISENSE max (see Figure 4) 80 250 1. Parameter guaranteed by design, it is not tested. 2. Fault condition includes: power limitation and overtemperature. Table 9. Current sense (8 V < VCC < 18 V) (continued) Symbol Parameter Test conditions Min. Typ. Max. Unit |
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