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MPXM2102AS Datasheet(PDF) 464 Page - Motorola, Inc |
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MPXM2102AS Datasheet(HTML) 464 Page - Motorola, Inc |
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464 / 670 page ![]() 3–318 Motorola Sensor Device Data www.motorola.com/semiconductors AN1525 The A-B-C'sof Signal-Conditioning Amplifier Design for Sensor Applications Prepared by: Eric Jacobsen and Jeff Baum Sensor Applications Engineering Motorola Signal Products Division Phoenix, AZ INTRODUCTION Although fully signal–conditioned, calibrated, and temperature compensated monolithic sensor IC’s are commercially available today, there are many applications where the flexibility of designing custom signal–conditioning is of great benefit. Perhaps the need for a versatile low–level sensor output is best illustrated by considering two particular cases that frequently occur: (1) the user is in a prototyping phase of development and needs the ability to make changes rapidly to the overall transfer function of the combined sensor/amplifier subsystem, (2) the specific desired transfer function does not exist in a fully signal–conditioned, precision–trimmed sensor product (e.g., a signal–conditioned device is precision trimmed over a different pressure range than that of the application of interest). In such cases, it is obvious that there will always be a need for low–level, nonsignal–conditioned sensors. Given this need, there is also a need for sensor interface amplifier circuits that can signal condition the “raw” sensor output to a usable level. These circuits should also be user friendly, simple, and cost effective. Today’s unamplified solid–state sensors typically have an output voltage of tens of millivolts (Motorola’s basic 10 kPa pressure sensor, MPX10, has a typical full–scale output of 58 mV, when powered with a 5 V supply). Therefore, a gain stage is needed to obtain a signal large enough for additional processing. This additional processing may include digitization by a microcontroller’s analog to digital (A/D) converter, input to a comparator, etc. Although the signal–conditioning circuits described here are applicable to low–level, differential–voltage output sensors in general, the focus of this paper will be on interfacing pressure sensors to amplifier circuits. This paper presents a basic two operational–amplifier signal–conditioning circuit that provides the desired characteristics of an instrumentation amplifier interface: • High input impedance • Low output impedance • Differential to single–ended conversion of the pressure sensor signal • High gain capability For this two op–amp circuit, additional modifications to the circuit allow (1) gain adjustment without compromising common mode rejection and (2) both positive and negative dc level shifts of the zero pressure offset. Varying the gain and offset is desirable since full–scale span and zero pressure offset voltages of pressure sensors will vary somewhat from unit to unit. Thus, a variable gain is desirable to fine tune the sensor’s full–scale span, and a positive or negative dc level shift (offset adjustment) of the pressure sensor signal is needed to translate the pressure sensor’s signal–conditioned output span to a specific level (e.g., within the high and low reference voltages of an A/D converter). For the two op–amp gain stage, this paper will present the derivation of the transfer function and simplified transfer function for pressure sensor applications, the derivation and explanation of the gain stage with a gain adjust feature, and the derivation and explanation of the gain stage with the dc level shift modification. Adding another amplifier stage provides an alternative method of creating a negative dc voltage level shift. This stage is cascaded with the output from the two op–amp stage ( Note: gain of the two op–amp stage will be reduced due to additional gain provided by the second amplifier stage). For this three op–amp stage, the derivation of the transfer function, simplified transfer function, and the explanation of the negative dc level shift feature will be presented. GENERAL NOTE ON OFFSET ADJUSTMENT Pressure sensor interface circuits may require either a positive or a negative dc level shift to adjust the zero pressure offset voltage. As described above, if the signal–conditioned pressure sensor voltage is input to an A/D, the sensor’s output dynamic range must be positioned within the high and low reference voltages of the A/D; i.e., the zero pressure offset voltage must be greater than (or equal to) the low reference voltage and the full–scale pressure voltage must be less than (or equal to) the high reference voltage (see Figure 1). Otherwise, voltages above the high reference will be digitally converted as 255 decimal (for 8–bit A/D), and voltages below the low reference will be converted as 0. This creates a nonlinearity in the analog–to–digital conversion. MOTOROLA SEMICONDUCTOR APPLICATION NOTE Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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