2

IR5001

www.irf.com

duty cycle pulse testing is used which keeps junction and case temperatures equal to the ambient temperature.

ABSOLUTE MAXIMUM RATINGS

CAUTION:

1. Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This

is a stress only rating and operation of the device at these or any other conditions above those indicated in the

operational section of this specification is not implied.

2. This device is ESD sensitive. Use of standard ESD handling precautions is required.

.

ELECTRICAL SPECIFICATIONS

Vline Voltage

-5.0V to 100V (continuous)

Vcc Voltage

-0.5V to 15VDC

Icc Current

5mA

INN, INP Voltage

-5.0V to 100V (continuous)

FETch, FETst

-0.5V to 5.5V

FETst Sink Current

10mA

Junction Temperature

-40°C to 125°C

Storage Temperature Range

-65°C to 150°C

PARAMETERS

SYMBOL

TEST CONDITION

MIN TYP MAX UNITS

Vline=25V

0.14

0.3

0.5

Vline=36V

0.2

0.5 0.75

Vline=100V, Note 1

1.2

1.7

2.2

VCC output voltage

Vcc(out)

Vline=25V

10.2 12.5 13.9

V

UVLO Section

UVLO ON Threshold Voltage

Vcc(ON)

Vline=open, VINP=0; VINN= -

0.3V

Vcc increased until Vout switches

from LO to HI, Note 2

8.3

9.6 10.9

UVLO OFF Threshold Voltage

Vcc(OFF)

Vline=open, VINP=0, VINN=-

0.3V, Vcc is decreased until

Vout switches from HI to LO

5.7

7.2

8.5

UVLO Hysteresis

1.6

2.3

2.8

V

Input Comparator Section

Input Offset Voltage (VINP-

VINN)

Vos

VINP=0V and VINN Ramping up,

VOUT changes from HI to LO,

Fig.3

-7.9 -4.0

0

Input Hysteresis Voltage

Vhyst

VINP=0,VINN ramping down,

Figures 3 and 4

13

31

44

(INN) Input Bias Current

I(INN)

VINP=0V, VINN=36V

0.2

0.5

0.9

(INP) Input Bias Current

I(INP)

VINN=0V, VINP=36V

0.2

0.5

0.9

mA

mV

Iline

Bias Section

Vline Bias Current

V

mA