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SN54SC3T97-SEP Datasheet (PDF) - Texas Instruments

SN54SC3T97-SEP Datasheet PDF - Texas Instruments
Part # SN54SC3T97-SEP
Download  SN54SC3T97-SEP Download
File Size   990.76 Kbytes
Page   21 Pages
Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments
Description SN54SC3T97-SEP Radiation Tolerant, Configurable Multiple-Function Gate

SN54SC3T97-SEP Datasheet (PDF)

Go To PDF Page Download Datasheet
SN54SC3T97-SEP Datasheet PDF - Texas Instruments

Part # SN54SC3T97-SEP
Download  SN54SC3T97-SEP Click to download

File Size   990.76 Kbytes
Page   21 Pages
Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments
Description SN54SC3T97-SEP Radiation Tolerant, Configurable Multiple-Function Gate

SN54SC3T97-SEP Datasheet (HTML) - Texas Instruments


SN54SC3T97-SEP Product details

1 Features
• Vendor item drawing available, VID
V62/23633-01XE
• Total ionizing dose characterized at 30 krad (Si)
– Total ionizing dose radiation lot acceptance
testing (TID RLAT) for every wafer lot to 30
krad (Si)
• Single-event effects (SEE) characterized:
– Single event latch-up (SEL) immune to linear
energy transfer (LET) = 43 MeV-cm2 /mg
– Single event transient (SET) characterized to
43 MeV-cm2 /mg
• Wide operating range of 1.2 V to 5.5 V
• Single-supply translating gates at 5/3.3/2.5/1.8/1.2
V VCC
– TTL compatible inputs:
• Up translation:
– 1.8-V – Inputs from 1.2 V
– 2.5-V – Inputs from 1.8 V
– 3.3-V – Inputs from 1.8 V, 2.5 V
– 5.0-V – Inputs from 2.5 V, 3.3 V
• Down translation:
– 1.2-V – Inputs from 1.8 V, 2.5 V, 3.3 V,
5.0 V
– 1.8-V – Inputs from 2.5 V, 3.3 V, 5.0 V
– 2.5-V – Inputs from 3.3 V, 5.0 V
– 3.3-V – Inputs from 5.0 V
• 5.5 V tolerant input pins
• Output drive up to 25 mA AT 5-V
• Latch-up performance exceeds 250 mA per
JESD 17
• Space enhanced plastic (SEP)
– Controlled baseline
– Gold bondwire
– NiPdAu lead finish
– One assembly and test site
– One fabrication site
– Military (–55°C to 125°C) temperature range
– Extended product life cycle
– Product traceability
– Meets NASAs ASTM E595 outgassing
specification

2 Applications
• Enable or disable a digital signal
• Controlling an indicator LED
• Translation between communication modules and
system controllers

3 Description
The SN54SC3T97-SEP device features configurable
multiple functions with extended voltage operation
to allow for level translation.. The output state is
determined by eight patterns of 3-bit input. The user
can choose the logic functions MUX, AND, OR,
NAND, NOR, inverter, and noninverter. The output
level is referenced to the supply voltage (VCC) and
supports 1.2-V, 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS
levels.
The input is designed with a lower threshold circuit to
support up translation for lower voltage CMOS inputs
(for example 1.2 V input to 1.8 V output or 1.8 V input
to 3.3 V output). Additionally, the 5-V tolerant input
pins enable down translation (for example 3.3 V to 2.5
V output).




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About Texas Instruments


Texas Instruments (TI) is a publicly traded company that designs and manufactures semiconductor and computer technology products.

It was founded in 1930 and is headquartered in Dallas, Texas.

TI is a global leader in the production of analog and digital signal processing (DSP) integrated circuits, as well as embedded processors and other microcontroller products.

The company serves customers in a variety of industries, including automotive, communications, computing, industrial, and consumer electronics.

TI's product portfolio includes data converters, amplifiers and comparators, power management ICs, microcontrollers, sensors, and wireless connectivity solutions, among others.

TI is committed to innovation and customer satisfaction, and has a long history of delivering high-quality, reliable products to its customers.

With a focus on sustainability and energy efficiency, TI is dedicated to making a positive impact on the world through its technology and products.

*This information is for general informational purposes only, we will not be liable for any loss or damage caused by the above information.




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