FEATURES
► Complete 16-bit data acquisition system
► Simultaneous sampling of 8 internally buffered channels
► 250 kSPS per channel throughput
► Differential, wide common-mode range inputs
► ±75 pA typical input leakage at 25°C
► Full-scale input step settling time < 300 ns
► Integrated reference and reference buffer (4.096 V)
► Integrated supply decoupling capacitors
► 27 mW per channel at 250 kSPS, scales with throughput
► Minimal external signal conditioning
► Seamless high dynamic range
► Per sample, per channel automatic gain ranging
► Maintains ppm-level INL
► Per channel SoftSpan input ranges, bipolar or unipolar
► ±40 V, ±25 V, ±20 V, ±12.5 V, ±10 V, ±6.25 V, ±5 V, ±2.5 V
► 0 V to 40 V, 25 V, 20 V, 12.5 V, 10 V, 6.25 V, 5 V, 2.5 V
► Rail-to-rail input overdrive tolerance
► High performance
► INL: ±160 μV typical (±40 V range)
► SNR: 94.6 dB single-conversion typical (±40 V range)
► DR: 98.1 dB single-conversion typical (±40 V range)
► THD: −117 dB typical (±40 V range)
► CMRR: 120 dB typical
► Digital flexibility
► SPI CMOS (0.9 V to 5.25 V) and LVDS serial input and output
► Optional oversampling with 16-bit digital averaging
► Optional offset, gain, and phase correction
► 7.00 mm × 7.00 mm, 64-ball BGA full solution footprint
APPLICATIONS
► Automatic test equipment
► Avionics and aerospace
► Instrumentation and control systems
► Semiconductor manufacturing
► Test and measurement