Features
• JEDEC standard Raw Card E Design
• Industry Standard Advanced Memory Buffer (AMB)
• High-speed differential point-to-point link interface at 1.5V (JEDEC draft spec)
    - 14 north-bound (NB) high speed serial lanes
    - 10 south-bound (SB) high speed serial lanes
• Various features/modes:
    - MemBIST and IBIST test functions
    - Transparent mode and direct access mode for DRAM testing
    - Interface for a thermal sensor and status indicator
• Channel error detection and reporting
• Automatic DDR2 SDRAM bus and channel calibration
• SPD (serial presence detect) with 1piece of 256 byte serial EEPROM