Copyright

 ANPEC Electronics Corp.

Rev. A.1 - Oct., 2001

APC308

www.anpec.com.tw

14

Reliability test program

Test item

Method

Description

SOLDERABILITY

MIL-STD-883D-2003

245°C , 5 SEC

HOLT

MIL-STD-883D-1005.7

1000 Hrs Bias @ 125 °C

PCT

JESD-22-B, A102

168 Hrs, 100 % RH , 121°C

TST

MIL-STD-883D-1011.9

-65°C ~ 150°C, 200 Cycles

ESD

MIL-STD-883D-3015.7

VHBM > 2KV, VMM > 200V

Latch-Up

JESD 78

Carrier Tape & Reel Dimensions

A

J

B

T2

T1

C

t

Ao

E

W

Po

P

Ko

Bo

D1

D

F

P1

(mm)

Application

A

B

C

J

T1

T2

W

P

E

SOP- 8

330 ± 1 62 ± 1.5

12.75

+0.1 5

2 + 0.5 12.4 + 0.2 2 ± 0.2 12 + 0.3

- 0.1

8.0 ± 0.1 1.75 ± 0.1

TSSOP- 8 330 ± 1 62 ± 1.5

12.75

±0.1 5

2 + 0.5 12.4 + 0.2 2 ± 0.2 12 + 0.3

- 0.1

8.0 ± 0.1 1.75 ± 0.1

Application

F

D

D1

Po

P1

Ao

Bo

Ko

t

SOP- 8

5.5 ± 0.1 1.55 ± 0.1 1.5+0.25 4.0 ± 0.1 2.0 ± 0.1 6.4 ± 0.1 5.2 ± 0.1 2.1 ± 0.1

0.3

±0.013

TSSOP- 8 5.5 ± 0. 1.5 + 0.1 1.5 + 0.1 4.0 ± 0.1 2.0 ± 0.1 7.0 ± 0.1 3.6 ± 0.3 1.6 ± 0.1

0.3

±0.013