CS1124

http://onsemi.com

2

MAXIMUM RATINGS*

Rating

Value

Unit

Storage Temperature Range

–65 to 150

°C

Ambient Operating Temperature

–40 to 125

°C

Supply Voltage Range (continuous)

–0.3 to 7.0

V

Input Voltage Range (at any input, R1 = R2 = 22 k)

–250 to 250

V

Maximum Junction Temperature

150

°C

ESD Susceptibility (Human Body Model)

2.0

kV

Lead Temperature Soldering:

Reflow: (SMD styles only) (Note 1)

230 peak

°C

1. 60 second maximum above 183

°C.

*The maximum package power dissipation must be observed.

Characteristic

Test Conditions

Min

Typ

Max

Unit

Operating Current Supply

–

–

5.0

mA

Sensor Inputs

Input Threshold – Positive

135

135

160

160

185

185

mV

mV

Input Threshold – Negative

–185

135

–160

160

–135

185

mV

mV

Input Bias Current (INP1, INP2)

–16

–11

–6.0

µA

Input Bias Current (DIAG)

–

–

1.0

µA

–

152

100

155

–

157

%INP

%INP

Bias Current Matching

–1.0

0

1.0

µA

Input Clamp – Negative

–0.5

–0.5

–0.25

–0.30

0

0

V

V

Input Clamp – Positive

5.0

7.0

9.0

V

Output Low Voltage

–

0.2

0.4

V

Output High Voltage

–

V

Mode Change Time Delay

–

0

–

20

µs

Input to Output Delay

–

1.0

20

µs

Output Rise Time

–

0.5

2.0

µs

Output Fall Time

–

0.05

2.0

µs

Open–Sensor Positive Threshold

29.4

54

86.9

k

Ω

Logic Inputs

DIAG Input Low Threshold

–

–

–

0.2

V

DIAG Input High Threshold

–

0.7

–

–

V

DIAG Input Resistance

8.0

8.0

22

22

70

70

k

Ω

k

Ω

2. This parameter is guaranteed by design, but not parametrically tested in production.