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LTM4630 Datasheet(PDF) 20 Page - Linear Technology |
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LTM4630 Datasheet(HTML) 20 Page - Linear Technology |
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20 / 34 page ![]() LTM4650 20 4650fb For more information www.linear.com/LTM4650 APPLICATIONS INFORMATION Thermal Considerations and Output Current Derating The thermal resistances reported in the Pin Configuration section of the data sheet are consistent with those param- eters defined by JESD51-9 and are intended for use with finite element analysis (FEA) software modeling tools that leverage the outcome of thermal modeling, simulation, and correlation to hardware evaluation performed on a µModulepackagemountedtoahardwaretestboard—also defined by JESD51-9 (“Test Boards for Area Array Surface MountPackageThermalMeasurements”).Themotivation for providing these thermal coefficients is found in JESD 51-12 (“Guidelines for Reporting and Using Electronic Package Thermal Information”). Many designers may opt to use laboratory equipment and a test vehicle such as the demo board to anticipate the µModule regulator’s thermal performance in their ap- plication at various electrical and environmental operating conditions to compliment any FEA activities. Without FEA software, the thermal resistances reported in the Pin Con- figuration section are in-and-of themselves not relevant to providing guidance of thermal performance; instead, the derating curves provided in the data sheet can be used in a manner that yields insight and guidance pertaining to one’s application-usage, and can be adapted to correlate thermal performance to one’s own application. The Pin Configuration section typically gives four thermal coefficients explicitly defined in JESD 51-12; these coef- ficients are quoted or paraphrased below: 1. θJA, the thermal resistance from junction to ambient, is the natural convection junction-to-ambient air thermal resistance measured in a one cubic foot sealed enclo- sure.Thisenvironmentissometimesreferredtoas“still air” although natural convection causes the air to move. This value is determined with the part mounted to a JESD 51-9 defined test board, which does not reflect an actual application or viable operating condition. 2. θJCbottom, the thermal resistance from junction to the bottom of the product case, is the junction-to-board thermal resistance with all of the component power dissipation flowing through the bottom of the package. In the typical µModule, the bulk of the heat flows out Combining like terms, then simplifying the natural log terms yields: ΔVD = T(KELVIN) • KD • lN(10) and redefining constant K'D=KD•IN(10) = 198µV K yields ΔVD = K'D • T(KELVIN) Solving for temperature: T(KELVIN)= ΔVD K'D (°CELSIUS)= T(KELVIN)–273.15 where 300°K = 27°C means that is we take the difference in voltage across the diode measured at two currents with a ratio of 10, the resulting voltage is 198μV per Kelvin of the junction with a zero intercept at 0 Kelvin. ThediodeconnectedPNPtransistorattheTEMPpincanbe used to monitor the internal temperature of the LTM4650. See Figure 23 for an example. Figure 8. Diode Voltage VD vs Temperature T(°C) TEMPERATURE (°C) –50 –25 0.3 0.5 0.8 0 50 75 0.4 0.7 0.6 25 100 4650 F08 125 |
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