LTM8055 datasheet(4/26 Pages) LINER

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LTM8005

8005f

For more information www.linear.com/LTM8005

ELECTRICAL CHARACTERISTICS

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

EN/UVLO Threshold Voltage Falling

1.22

EN/UVLO Threshold Voltage Rising

1.24

EN/UVLO Pin Bias Current

EN/UVLO=1.15V, VIN = 12V

µA

OPENLED Output Low

IOPENLED =0.5mA

0.3

SHORTLED Output Low

ISHORTLED =0.5mA

0.3

OVLO Threshold Voltage

Rising

Falling

1.21

1.17

1.30

1.26

The l denotes the specifications which apply over the specified operating

temperature range, otherwise specifications are at TA = 25°C. CTRL1 = CTRL2 = PWM = 5V, unless otherwise noted (Note 2).

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: The LTM8005E is guaranteed to meet performance specifications

from 0°C to 125°C internal. Specifications over the full –40°C to

125°C internal operating temperature range are assured by design,

characterization and correlation with statistical process controls. The

LTM8005I is guaranteed to meet specifications over the full –40°C

to 125°C internal operating temperature range. The LTM8005MP is

guaranteed to meet specifications over the full –55°C to 125°C internal

operating temperature range. The LTM8005H is guaranteed to meet

specifications over the full –40°C to 150°C internal operating temperature

range. Note that the maximum internal temperature is determined by

specific operating conditions in conjunction with board layout, the rated

package thermal resistance and other environmental factors.

Note 3: The LTM8005 contains over-temperature protection that is

intended to protect the device during momentary overload conditions. The

internal temperature exceeds the maximum operating junction temperature

when the over-temperature protection is active. Continuous operation

above the specified maximum operating junction temperature may impair

device reliability.

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