| Electronic Components Datasheet Search |
|
MMRF1008HS Datasheet(PDF) 2 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
MMRF1008HS Datasheet(HTML) 2 Page - NXP Semiconductors |
|
2 / 19 page ![]() 2 RF Device Data Freescale Semiconductor, Inc. MMRF1008H MMRF1008HS MMRF1008GH Table 1. Maximum Ratings Rating Symbol Value Unit Drain--Source Voltage VDSS --0.5, +100 Vdc Gate--Source Voltage VGS --6.0, +10 Vdc Storage Temperature Range Tstg -- 65 to +150 C Case Operating Temperature TC 150 C Operating Junction Temperature (1) TJ 225 C Table 2. Thermal Characteristics Characteristic Symbol Value (2) Unit Thermal Resistance, Junction to Case Case Temperature 80C, 275 W Peak 128 sec Pulse Width, 10% Duty Cycle, 50 Vdc, IDQ = 100 mA, 1030 MHz ZJC 0.08 C/W Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 2, passes 2600 V Machine Model (per EIA/JESD22--A115) B, passes 200 V Charge Device Model (per JESD22--C101) IV, passes 2000 V Table 4. Electrical Characteristics (TA =25C unless otherwise noted) Characteristic Symbol Min Typ Max Unit Off Characteristics Gate--Source Leakage Current (VGS =5 Vdc, VDS =0 Vdc) IGSS — — 10 Adc Drain--Source Breakdown Voltage (VGS =0 Vdc, ID = 100 mA) V(BR)DSS 110 — — Vdc Zero Gate Voltage Drain Leakage Current (VDS =50 Vdc, VGS =0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS =90 Vdc, VGS =0 Vdc) IDSS — — 100 Adc On Characteristics Gate Threshold Voltage (VDS =10 Vdc, ID = 662 Adc) VGS(th) 0.9 1.7 2.4 Vdc Gate Quiescent Voltage (VDD =50 Vdc, ID = 100 mAdc, Measured in Functional Test) VGS(Q) 1.7 2.4 3.2 Vdc Drain--Source On--Voltage (VGS =10 Vdc, ID =1.6 Adc) VDS(on) — 0.25 — Vdc Dynamic Characteristics (3) Reverse Transfer Capacitance (VDS =50 Vdc 30 mV(rms)ac @ 1 MHz, VGS =0 Vdc) Crss — 0.46 — pF Output Capacitance (VDS =50 Vdc 30 mV(rms)ac @ 1 MHz, VGS =0 Vdc) Coss — 352 — pF Input Capacitance (VDS =50 Vdc, VGS =0 Vdc 30 mV(rms)ac @ 1 MHz) Ciss — 695 — pF 1. Continuous use at maximum temperature will affect MTTF. 2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955. 3. Part internally matched both on input and output. (continued) |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |