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MMRF1008HS Datasheet(PDF) 2 Page - NXP Semiconductors

Part # MMRF1008HS
Description  RF Power Field Effect Transistors
PDF  19 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MMRF1008HS Datasheet(HTML) 2 Page - NXP Semiconductors

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RF Device Data
Freescale Semiconductor, Inc.
MMRF1008H MMRF1008HS MMRF1008GH
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain--Source Voltage
VDSS
--0.5, +100
Vdc
Gate--Source Voltage
VGS
--6.0, +10
Vdc
Storage Temperature Range
Tstg
-- 65 to +150
C
Case Operating Temperature
TC
150
C
Operating Junction Temperature (1)
TJ
225
C
Table 2. Thermal Characteristics
Characteristic
Symbol
Value (2)
Unit
Thermal Resistance, Junction to Case
Case Temperature 80C, 275 W Peak 128 sec Pulse Width, 10% Duty Cycle,
50 Vdc, IDQ = 100 mA, 1030 MHz
ZJC
0.08
C/W
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22--A114)
2, passes 2600 V
Machine Model (per EIA/JESD22--A115)
B, passes 200 V
Charge Device Model (per JESD22--C101)
IV, passes 2000 V
Table 4. Electrical Characteristics (TA =25C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Off Characteristics
Gate--Source Leakage Current
(VGS =5 Vdc, VDS =0 Vdc)
IGSS
—
—
10
Adc
Drain--Source Breakdown Voltage
(VGS =0 Vdc, ID = 100 mA)
V(BR)DSS
110
—
—
Vdc
Zero Gate Voltage Drain Leakage Current
(VDS =50 Vdc, VGS =0 Vdc)
IDSS
—
—
10
Adc
Zero Gate Voltage Drain Leakage Current
(VDS =90 Vdc, VGS =0 Vdc)
IDSS
—
—
100
Adc
On Characteristics
Gate Threshold Voltage
(VDS =10 Vdc, ID = 662 Adc)
VGS(th)
0.9
1.7
2.4
Vdc
Gate Quiescent Voltage
(VDD =50 Vdc, ID = 100 mAdc, Measured in Functional Test)
VGS(Q)
1.7
2.4
3.2
Vdc
Drain--Source On--Voltage
(VGS =10 Vdc, ID =1.6 Adc)
VDS(on)
—
0.25
—
Vdc
Dynamic Characteristics (3)
Reverse Transfer Capacitance
(VDS =50 Vdc  30 mV(rms)ac @ 1 MHz, VGS =0 Vdc)
Crss
—
0.46
—
pF
Output Capacitance
(VDS =50 Vdc  30 mV(rms)ac @ 1 MHz, VGS =0 Vdc)
Coss
—
352
—
pF
Input Capacitance
(VDS =50 Vdc, VGS =0 Vdc  30 mV(rms)ac @ 1 MHz)
Ciss
—
695
—
pF
1. Continuous use at maximum temperature will affect MTTF.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.
3. Part internally matched both on input and output.
(continued)



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