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HDS20M Datasheet(PDF) 2 Page - Diodes Incorporated

Part # HDS20M
Description  2A SURFACE MOUNT GLASS PASSIVATED BRIDGE RECTIFIER
PDF  5 Pages
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Manufacturer  DIODES [Diodes Incorporated]
Direct Link  http://www.diodes.com
Logo DIODES - Diodes Incorporated

HDS20M Datasheet(HTML) 2 Page - Diodes Incorporated

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HDS20M
Document number: DS39300 Rev. 3 - 2
2 of 5
www.diodes.com
December 2017
© Diodes Incorporated
HDS20M
Maximum Ratings (@TA = +25°C, unless otherwise specified.)
Single phase, half wave, 60Hz, resistive or inductive load.
For capacitive load, derate current by 20%.
Characteristic
Symbol
Value
Unit
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
VRRM
VRWM
VR
1000
V
RMS Reverse Voltage
VR(RMS)
700
V
Average Rectified Output Current (Note 5) @ TC = +88°C
IO
2.0
A
Non-Repetitive Peak Forward Surge Current, 8.3ms
Single Half Sine-Wave Superimposed on Rated Load
IFSM
55
A
Non-Repetitive Peak Forward Surge Current, 1ms
Single Half Sine-Wave Superimposed on Rated Load
IFSM
110
A
I
2
t Rating for Fusing (1ms < t < 8.3ms)
I
2
t
8.03
A
2
S
Thermal Characteristics
Characteristic
Symbol
Value
Unit
Typical Thermal Resistance, Junction to Ambient (Note 6)
(Per Element)
RθJA
20
°C/W
Typical Thermal Resistance, Junction to Case (Per Element)
RθJC
16
°C/W
Typical Thermal Resistance, Junction to Lead (Per Element)
RθJL
18
°C/W
Operating and Storage Temperature Range
TJ, TSTG
-55 to +150
°C
Electrical Characteristics (@TA = +25°C, unless otherwise specified.)
Characteristic
Symbol
Min
Typ
Max
Unit
Test Condition
Reverse Breakdown Voltage (Note 7)
V(BR)R
1,000
—
—
V
IR = 5μA
Forward Voltage (Per Element)
VF
—
0.92
0.95
V
IF = 1A, TA = +25°C
Leakage Current (Note 7) (Per Element)
IR
—
—
0.11
45
5
100
μA
VR = 1,000V, TA = +25°C
VR = 1,000V, TA = +125°C
Total Capacitance (Per Element)
CT
—
13
—
pF
VR = 4V, f = 1.0MHz
Notes:
5. Perform static test after the temperature of oven is steady 20 minutes.
6. Device mounted on glass epoxy substrate with 1oz/ft
2, 30mmx30mm copper pad per pin.
7. Short duration pulse test used to minimize self-heating effect.



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