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FUSB302TMPX Datasheet(PDF) 11 Page - ON Semiconductor |
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FUSB302TMPX Datasheet(HTML) 11 Page - ON Semiconductor |
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11 / 36 page ![]() 10 Flush Rx-FIFO with Built-In Self Test (BIST) Test Data. During PD compliance testing, BIST test packets are used to test physical layer of the PD interface such as, frequency derivation, Amplitude measure and etc. The one BIST test data packet has 7 data objects (28byte data), header and CRC, but the message ID doesn ‟t change, the packet should be ignored and not acted on by the PD policy engine. The PD protocol layer does need to send a GoodCRC message back after every packet. The BIST data can arrive continuously from a tester, which could cause the FUSB302T Rx FIFO to overflow and the PD protocol layer to stop sending GoodCRC messages unless the FIFO is read or cleared quickly. The FUSB302T has a special register bit in the I2C registers, bit[5] of address 0x09, that when the bit is set, all the data received next will be flushed from the RxFIFO automatically and the PD protocol layer will keep sending GoodCRC messages back. Once BIST test is done, tester sends HardReset, so with the HardReset, processor has to write the bit back to disable. Also, if the bit can be de-selected anytime, then the coming packet has to be managed by protocol layer and policy engine. |
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