CAT25M02

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2

DEVICE MARKINGS

SOIC−8 Package

25M02A = Specific Device Code

A = Assembly Site

Y = Year of Production, Last Number

M = Assembly Operation Month

ZZZ = Assembly Lot Number, Last Three Numbers

WLCSP−8 Package

2MSA = Specific Device Code

A = Assembly Site

L = Wafer Lot Number

Y = Year of Production, Last Number

W = Work Week Number

25M02A

AYMZZZ

2MSA

ALYW

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Operating Temperature

–40 to +125

°C

Storage Temperature

–65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

–0.5 to +6.5

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

Symbol

Parameter

Min

Units

Endurance

1,000,000

Program/Erase Cycles

Data Retention

100

Years

3. The device uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when a single byte

has to be written, 4 bytes (including the ECC bits) are re−programmed. It is recommended to write by multiple of 4 bytes located at addresses

4N, 4(N+1), 4(N+2), 4(N+3), in order to benefit from the maximum number of write cycles.

4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.