f=1KHz

f=1KHz

f=1KHz

30°C/W

-65°C to +150°C

300°C

-40°C to +125°C

-55°C to +125°C

150°C

ABSOLUTE MAXIMUM RATINGS

Storage Temperature Range

Lead Temperature Range

(10 Seconds)

Case Operating Temperature

MSK610

MSK610B

Junction Temperature

Supply Voltage

Supply Voltage

Input Voltage Range

Supply Voltage (Input Stage)

Thermal Resistance

(Output Devices)

STATIC

Input Offset Voltage Drift

DYNAMIC CHARACTERISTICS

Output Voltage Swing

Peak Output Current

Full Power Output Frequency

Unity Gain Bandwidth

Slew Rate

Voltage Gain

Settling Time to 1%

Settling Time to 0.1%

Group A

Subgroup

1,2,3

1,2,3

1,2,3

1,2,3

1

2,3

1

2,3

2,3

-

-

-

4

4

4

4

4

4

-

-

Typ.

1.0

12

12

12

±1.0

±2.0

50

100

±10

±15

120

-15

110

±250

9

100

5000

100

200

500

Min.

-

-

-

-

-

-

-

-

-

±12

50

-18

100

±200

2

80

4000

80

-

-

Max.

2.0

30

25

25

±5.0

±10.0

250

500

±50

±18

130

0

-

-

-

-

-

-

-

-

Min.

-

-

-

-

-

-

-

-

-

±12

50

-18

100

±200

1

80

4000

80

-

-

Max.

2.0

35

28

28

±10

-

500

-

-

±18

130

0

-

-

-

-

-

-

-

-

MSK 610B

MSK 610

Parameter

Test Conditions

ELECTRICAL SPECIFICATIONS

1

Units

Typ.

1.0

12

12

12

±1.0

±2.0

50

100

±10

±15

120

-15

110

±250

9

100

5000

100

200

500

Quiescent Current

Input Offset Voltage

Input Bias Current

2

2

2

2

2

2

6

mA

mA

mA

mA

mV

mV

nA

nA

µV/°C

V

V

V

Vpp

mA

MHz

MHz

V/µS

dB

nS

nS

1

2

3

4

5

6

This parameter is guaranteed by design but not tested. Typical parameters are representative of actual device performance but are for reference only.

Industrial grade devices shall be tested to subgroups 1 and 4 unless otherwise specified.

Military grade devices ('B' suffix) shall be 100% tested to subgroups 1,2,3 and 4.

Subgroup 1,4

Subgroup 2,5

Subgroup 3,6

NOTES:

2

Rev. A 8/00

2