Sales Information

Phone:(425) 353-3010

Fax: (425) 353-4030

SVRGA0508S - 5.0

E-mail: vptsales@vptpower.com

Web: www.vptpower.com

Page 8

SVRGA0508S Series

6.5 RADIATION HARDNESS ASSURANCE

VPT takes a conservative approach to radiation testing to ensure product performance in a space environment. VPT’s DLA-approved

Radiation Hardness Assurance (RHA) plan documents VPT’s processes and procedures for guaranteeing the performance of VPT

products under various environmental conditions in space including Total Ionizing Dose (TID) and Single-Event Effects (SEE).

Additionally, Enhanced Low Dose-Rate Sensitivity (ELDRS) effects are considered for all bipolar ICs used in the hybrid. Hardness is

guaranteed by a combination of both hybrid-level characterization and Radiation Lot Acceptance Testing (RLAT) of all sensitive

semiconductor piece-parts used within the hybrid.

6.5.1 Radiation Test and Performance Levels

Radiation Environment

Piece Part RLAT

Hybrid-Level

Characterization

Total Ionizing Dose

(TID)

High Dose Rate (HDR)

100 krad(Si)

100 krad(Si)

Low Dose Rate (LDR)

1

100 krad(Si)

100 krad(Si)

Single-Event Effects

(SEE)

Destructive (SEB, SEGR, SEL)

Not applicable

2

Non-Destructive (SET, SEU, SEFI)

Not applicable

1.

Piece-part LDR screening performed only on potentially ELDRS parts (bipolar ICs).

2.

to 1 second followed by a controlled soft-start of the converter. The non-destructive SEL manifests itself as a shutdown requiring user intervention to recover by

available in the Radiation Test Report.

6.5.2 RHA Plan Summary

Test

RHA Plan for SVR Series Isolated DC-DC Converters

Total Ionizing Dose (TID):

Sensitive semiconductor components undergo RLAT to 100 krad(Si) per

MIL-STD-883 Method 1019. Converters are characterized to 100 krad(Si).

Enhanced Low Dose Rate Sensitivity (ELDRS):

All bipolar linear ICs are characterized for ELDRS and tested in accordance

with MIL-STD-883 test method 1019 section 3.13

Single Event Effects (SEE):

events (SEL, SEB, SEGR) and functional interrupts (SEFI) under heavy ion

exposure. Converters are also characterized for cross-section and magnitude

of output transients (SET) for at least 3 different LET levels.

Radiation Lot Acceptance Testing (RLAT):

All production lots of sensitive semiconductor components undergo RLAT for

TID at HDR and/or LDR as appropriate per part type.

6.5.3 RHA Designators available on SMD

The SVRGA0508S series converters are available on SMD with RHA level R. See section 8.0 for full SMD number information.

6.5.4 Supporting Documentation Available (Contact Sales)

•

Radiation Hardness Assurance Plan:

DLA-approved RHA plan covering TID, SEE, and ELDRS

•

Worst-Case Analysis Report:

Detailed worst-case analysis including electrical stress/derating limits and

guaranteed circuit performance post-radiation and end of life

•

Radiation Test Summary Report:

Overview of piece-part RLAT and hybrid characterization for all guaranteed

environments. Also includes SEE cross-section data.

•

Reliability Report:

MTBF report based on MIL-HDBK-217 reliability calculations.

•

Thermal Analysis Report:

Component temperature rise analysis and measurement results.