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54LVC1G34 Datasheet(PDF) 1 Page - Silicon Supplies |
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54LVC1G34 Datasheet(HTML) 1 Page - Silicon Supplies |
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1 / 6 page ![]() Low Voltage CMOS Logic – 54LVC1G34 Single Buffer Gate in bare die form Rev 1.0 29/06/19 Features: Description Die Size (Unsawn) 420 x 380 17 x 15 µm mils Minimum Bond Pad Size 76 x 76 2.99 x 2.99 µm mils Die Thickness 280 (±20) 11.02 (±0.79) µm mils Top Metal Composition Al-Si-Cu 3 µm Back Metal Composition N/A – Bare Si Inputs directly interface TTL The 54LVC1G34 single buffer gate performs the Boolean function Y = A. The inverter can be driven by either 3.3V or 5V inputs enabling use of this device in a mixed 3.3V and 5V environment. The 54LVC1G34 operates over a 1.65V to 5.5V supply range with low power consumption and is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing damaging backflow current through the device when it is powered down. The device suits level translation and interfacing TTL to CMOS logic applications at low power. Inputs accept up to 5.5V enabling level translation down to VCC Wide Supply Voltage: VCC 1.65V - 5.5V Output Drive capability: ±24mA, VCC = 3.3V Low Quiescent Current: 10µA max High speed: tpd 5.2ns max, VCC = 3.3V Tiny die size. Die Dimensions in µm (mils) Ordering Information The following part suffixes apply: No suffix - MIL-STD-883 /2010B Visual Inspection “H” - MIL-STD-883 /2010B Visual Inspection + MIL-PRF-38534 Class H LAT “K” - MIL-STD-883 /2010A Visual Inspection (Space) + MIL-PRF-38534 Class K LAT 420 (17) LAT = Lot Acceptance Test. For further information on LAT process flows see below. www.siliconsupplies.com\quality\bare-die-lot-qualification Supply Formats: Mechanical Specification Default – Die in Waffle Pack (400 per tray capacity) Sawn Wafer on Tape – On request Unsawn Wafer – On request Die Thickness <> 280µm(11 Mils) – On request Assembled into Ceramic Package – On request Page 1 of 6 www.siliconsupplies.com |
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