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INA281B2IDBVT Datasheet(PDF) 11 Page - Texas Instruments |
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INA281B2IDBVT Datasheet(HTML) 11 Page - Texas Instruments |
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11 / 28 page ![]() IN+ IN± OUT - + Buffer Current Feedback VS GND RL R1 R1 Bias Load RSENSE ISENSE Load Supply 11 INA281 www.ti.com SBOSA29 – JUNE 2020 Product Folder Links: INA281 Submit Documentation Feedback Copyright © 2020, Texas Instruments Incorporated 7 Detailed Description 7.1 Overview The INA281 is a high- or low-side current-sense amplifier that offers a wide common-mode range, precision zero- drift topology, excellent common-mode rejection ratio (CMRR), high bandwidth, and fast slew rate. Different gain versions are available to optimize the output dynamic range based on the application. The INA281 is designed using a transconductance architecture with a current-feedback amplifier that enables low bias currents of 20 µA with a common-mode voltage of 110 V. 7.2 Functional Block Diagram 7.3 Feature Description 7.3.1 Amplifier Input Common-Mode Signal The INA281 supports large input common-mode voltages from –4 V to +110 V. Because of the internal topology, the common-mode range is not restricted by the power-supply voltage (VS). This allows for the INA281 to be used for both low- and high-side current-sensing applications. 7.3.1.1 Input-Signal Bandwidth The INA281 –3-dB bandwidth is gain-dependent, with several gain options of 20 V/V, 50 V/V, 100 V/V, 200 V/V, and 500 V/V. The unique multistage design enables the amplifier to achieve high bandwidth at all gains. This high bandwidth provides the throughput and fast response that is required for the rapid detection and processing of overcurrent events. The bandwidth of the device also depends on the applied VSENSE voltage. Figure 27 shows the bandwidth performance profile of the device over frequency as output voltage increases for each gain variation. As shown in Figure 27, the device exhibits the highest bandwidth with higher VSENSE voltages, and the bandwidth is higher with lower device gain options. Individual requirements determine the acceptable limits of error for high- frequency, current-sensing applications. Testing and evaluation in the end application or circuit is required to determine the acceptance criteria and validate whether or not the performance levels meet the system specifications. |
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