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LT3752MPFE#PBF Datasheet(PDF) 8 Page - Analog Devices |
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LT3752MPFE#PBF Datasheet(HTML) 8 Page - Analog Devices |
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8 / 52 page ![]() LT3752/LT3752-1 8 Rev. C For more information www.analog.com ELECTRICAL CHARACTERISTICS Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: The LT3752EFE/LT3752EFE-1 are guaranteed to meet performance specifications from 0°C to 125°C junction temperature. Specifications over the –40°C to 125°C operating junction temperature range are assured by design, characterization and correlation with statistical process controls. The LT3752IFE/LT3752IFE-1 are guaranteed to meet performance specifications from –40°C to 125°C junction temperature. The LT3752HFE/ LT3752HFE-1 are guaranteed to meet performance specifications from –40°C to 150°C junction temperature. The LT3752MPFE/LT3752MPFE-1 are tested and guaranteed to meet performance specifications from –55°C to 150°C junction temperature. Note 3: For maximum operating ambient temperature, see the Thermal Calculations section in the Applications Information section. Note 4: SYNC minimum and maximum thresholds are guaranteed by SYNC frequency range test using a clock input with guard banded SYNC levels of 0.7V low level and 1.7V high level. Note 5: Rise and fall times are measured between 10% and 90% of gate driver supply voltage. Note 6: Guaranteed by correlation to static test. Note 7: VIN start-up current is measured at VIN = VIN(ON) – 0.25V and then scaled by 1.18× to correlate to worst-case VIN current required for part start-up at VIN = VIN(ON). Note 8: Guaranteed by design. Note 9: ON times are measured between rising and falling edges at 50% of gate driver supply voltage. Note 10: Current flows out of pin. Note 11: Guaranteed by correlation to RTAS = 73.2k test. Note 12: tOA timing guaranteed by design based on correlation to measured tAO timing. Note 13: Guaranteed by correlation to RTAO = 44.2k test. Note 14: Guaranteed by correlation to RTOS = 14.7k test. Note 15: A 2µs one-shot of 20µA from the UVLO_VSEC pin allows communication between ICs to begin shutdown (useful when stacking supplies for more power ( = inputs in parallel/outputs in series)). The current is tested in a static test mode. The 2µs one-shot is guaranteed by design. Note 16: Guaranteed by correlation to RTBLNK = 14.7k test. PARAMETER CONDITIONS MIN TYP MAX UNITS HOUT Driver (Housekeeping Controller) HOUT Rise Time CL = 1nF (Note 5), INTVCC = 12V 13 ns HOUT Fall Time CL = 1nF (Note 5), INTVCC = 12V 12 ns HOUT Low Level 0.1 V HOUT High Level LT3752 LT3752-1 INTVCC = 12V 11.9 11.9 V V HOUT Low Level in Shutdown UVLO_VSEC = 0V, INTVCC = 12V, IHOUT = 1mA Into the Pin 0.25 V HOUT Maximum Duty Cycle HCOMP = 2.7V, RT = 24.9k 90 95 % HOUT Minimum ON Time CL = 1nF (Note 9), INTVCC = 12V 350 ns Soft-Start (HSS) (Housekeeping Controller) HSS (Internal) Ramp Time (tHSS) HCOMP SW ≥ HCOMP VOH – 0.1V 2.2 4 ms Oscillator (Housekeeping Controller) Frequency (fHOUT) (fOSC Folded Back) (LT3752) HFB = 0.8V, RT = 24.9k, SS1 = 0V 55 65 75 kHz Frequency (fHOUT) (fOSC Folded Back) (LT3752-1) HFB = 0.8V, RT = 24.9k, SS1 = 0V 119 141 163 kHz Frequency (fHOUT) (Full-Scale fOSC) HFB = 1.15V, HCOMP = 2.7V l 279 300 321 kHz The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. VIN = 12V, UVLO_VSEC = 2.5V. |
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