LTC2995 datasheet(7/90 Pages) AD

7 / 90 page

LTM2985

Rev. 0

For more information www.analog.com

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: Full scale ADC error. Measurements do not include reference error.

Note 3: Guaranteed by design, not subject to test.

Note 4: The input referred noise includes the contribution of internal

calibration operations.

Note 5: MUX configuration delay = default 1ms.

Note 6: Global configuration set to 60Hz rejection.

Note 7: Global configuration set to 50Hz rejection.

Note 8: Global configuration default 50Hz/60Hz rejection.

Note 9: The exact value of VREF is stored in the LTM2985 and used

for all measurement calculations. Temperature coefficient is measured

by dividing the maximum change in output voltage by the specified

temperature range.

Note 10: Analog power-up. Command status register inaccessible during

this time.

Note 11: Digital initialization. Begins at the conclusion of analog power-up.

Command status register is 0×80 at the beginning of digital initialization

and 0×40 at the conclusion.

Note 12: Long-term stability typically has a logarithmic characteristic

and therefore, changes after 1000 hours tend to be much smaller than

before that time. Total drift in the second thousand hours is normally less

than one third that of the first thousand hours with a continuing trend

toward reduced drift with time. Long-term stability will also be affected by

differential stresses between the IC and the board material created during

board assembly.

Note 13: Hysteresis in output voltage is created by package stress

that differs depending on whether the IC was previously at a higher or

lower temperature. Output voltage is always measured at 25°C, but

the IC is cycled to the hot or cold temperature limit before successive

measurements. Hysteresis measures the maximum output change for the

averages of three hot or cold temperature cycles. For instruments that

are stored at well controlled temperatures (within 20 or 30 degrees of

operational temperature), it is usually not a dominant error source. Typical

hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to

25°C, preconditioned by one thermal cycle.

Note 14: Differential Input Range is ±VREF/2.

Note 15: RTD and thermistor measurements are made ratiometrically.

As a result, current source excitation variation does not affect absolute

accuracy. Choose an excitation current such that largest sensor or RSENSE

resistance value, when driven by the nominal excitation current, will drop

1V or less. The extended ADC input range will accommodate variation in

excitation current and the ratiometric calculation will negate the absolute

value of the excitation current.

Note 16: 10-year data retention guaranteed for up to 1000 program cycles.

Note 17: Do not apply voltage or current sources to these pins. They must

be connected to capacitive loads only. Otherwise, permanent damage may

occur.

Note 18: Input leakage measured with VIN = –10mV and VIN = 2.5V.

Note 19: This Module includes overtemperature protection that is intended

to protect the device during momentary overload conditions. Junction

temperature will exceed 125°C when overtemperature protection is active.

Continuous operation above specified maximum operating junction

temperature may result in device degradation or failure.

Note 20: Device considered a 2-terminal device. Pin group A1 through C11

shorted together and pin group R1 through T11 shorted together.

Note 21: The rated dielectric insulation voltage should not be interpreted

as a continuous voltage rating.

LTM2985 EEPROM CHARACTERISTICS

The l denotes the specifications which apply over the

full operating temperature range, otherwise specifications are at TA = 25°C.

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Retention

(Notes 3, 16)

Years

Endurance

(Note 3)

10000

Cycles

Programming Time

Complete Transfer from RAM to EEPROM

2600

Read Time

Complete Transfer from EEPROM to RAM

LTC2995 Datasheet(PDF) 7 Page - Analog Devices

LTC2995 Datasheet(HTML) 7 Page - Analog Devices

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90

Datasheet Download

Link URL