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TLV9364IPWR Datasheet(PDF) 21 Page - Texas Instruments |
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TLV9364IPWR Datasheet(HTML) 21 Page - Texas Instruments |
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21 / 54 page ![]() An ESD event is very short in duration and very high voltage (for example; 1 kV, 100 ns), whereas an EOS event is long duration and lower voltage (for example; 50 V, 100 ms). The ESD diodes are designed for out-of-circuit ESD protection (that is; during assembly, test, and storage of the device before being soldered to the PCB). During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit (labeled ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level. Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events. 7.3.5 Overload Recovery Overload recovery is defined as the time required for the op amp output to recover from a saturated state to a linear state. The output devices of the op amp enter a saturation region when the output voltage exceeds the rated operating voltage, either due to the high input voltage or the high gain. After the device enters the saturation region, the charge carriers in the output devices require time to return back to the linear state. After the charge carriers return back to the linear state, the device begins to slew at the specified slew rate. Thus, the propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time. The overload recovery time for the TLV936x is approximately 170 ns. 7.3.6 Typical Specifications and Distributions Designers often have questions about a typical specification of an amplifier in order to design a more robust circuit. Due to natural variation in process technology and manufacturing procedures, every specification of an amplifier will exhibit some amount of deviation from the ideal value, like an amplifier's input offset voltage. These deviations often follow Gaussian ("bell curve"), or normal distributions, and circuit designers can leverage this information to guardband their system, even when there is not a minimum or maximum specification in the Electrical Characteristics table. 1 1 1 1 1 1 1 1 1 0.00002% 1 1 1 0.00002% -1 -21 -31 -41 -51 -61 +1 +21 +31 +41 +51 +61 34.13% 13.59% 34.13% 13.59% 2.145% 2.145% 0.13185% 0.13185% 0.00312% 0.00312% Figure 7-7. Ideal Gaussian Distribution Figure 7-7 shows an example distribution, where µ, or mu, is the mean of the distribution, and where σ, or sigma, is the standard deviation of a system. For a specification that exhibits this kind of distribution, approximately two-thirds (68.26%) of all units can be expected to have a value within one standard deviation, or one sigma, of the mean (from µ – σ to µ + σ). www.ti.com TLV9361, TLV9362, TLV9364 SBOSA67A – NOVEMBER 2021 – REVISED DECEMBER 2021 Copyright © 2021 Texas Instruments Incorporated Submit Document Feedback 21 Product Folder Links: TLV9361 TLV9362 TLV9364 |
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