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SSM3K341R Datasheet(PDF) 3 Page - Toshiba Semiconductor |
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SSM3K341R Datasheet(HTML) 3 Page - Toshiba Semiconductor |
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3 / 9 page ![]() SSM3K341R 3 6. Electrical Characteristics 6.1. Static Characteristics (Unless otherwise specified, Ta = 25 �) Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Drain-source breakdown voltage Gate threshold voltage Drain-source on-resistance (Note 1) (Note 2) (Note 3) Symbol IGSS IDSS V(BR)DSS V(BR)DSX Vth RDS(ON) Test Condition VGS = ±16 V VDS = 60 V ID = 10 mA, VGS = 0 V ID = 10 mA, VGS = -20 V VDS = 10 V, ID = 0.1 mA ID = 2 A, VGS = 4 V ID = 3 A, VGS = 4.5 V ID = 5 A, VGS = 10 V Min � � 60 40 1.5 � � � Typ. � � � � � 43 36 28 Max ±10 1 � � 2.5 69 51 36 Unit µA V mΩ Note 1: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain- source breakdown voltage is lowered in this mode. Note 2: Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (0.1 mA for this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON). Take this into consideration when using the device. Note 3: Pulse measurement. 6.2. Dynamic Characteristics (Unless otherwise specified, Ta = 25 �) Characteristics Input capacitance Reverse transfer capacitance Output capacitance Switching time (rise time) Switching time (turn-on time) Switching time (fall time) Switching time (turn-off time) Symbol Ciss Crss Coss tr ton tf toff Test Condition VDS = 10 V, VGS = 0 V, f = 1 MHz VDD = 30 V, ID = 3 A, VGS = 0 to 4.5 V, RG = 50 Ω Duty ≤ 1 %,Input: tr, tf < 5 ns, Common source, See Chapter 6.3. Min � � � � � � � Typ. 550 35 300 48 63 6 18 Max � � � � � � � Unit pF ns 6.3. Switching Time Test Circuit Fig. 6.3.1 Switching Time Test Circuit Fig. 6.3.2 Input Waveform/Output Waveform 6.4. Gate Charge Characteristics (Unless otherwise specified, Ta = 25 �) Characteristics Total gate charge (gate-source plus gate-drain) Gate-source charge 1 Gate-drain charge Symbol Qg Qgs1 Qgd Test Condition VDD = 48 V, ID = 2 A, VGS = 10 V Min � � � Typ. 9.3 1.8 2.0 Max � � � Unit nC 2021-02-03 Rev.8.0 ©2016-2021 Toshiba Electronic Devices & Storage Corporation |
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