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SST25PF040C Datasheet(PDF) 24 Page - Microchip Technology

Part # SST25PF040C
Description  4-Mbit, 3.3V, SPI Serial Flash
PDF  47 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

SST25PF040C Datasheet(HTML) 24 Page - Microchip Technology

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SST25PF040C
DS20005397F-page 24
 2015-2022 Microchip Technology Inc. and its subsidiaries
6.5
DC Characteristics
TABLE 6-5:
DC OPERATING CHARACTERISTICS
Symbol
Parameter
Limits
Test Conditions
Min.
Typ.(1)
Max.
Units
IDDR1
Read Current
—
—
6
mA
CE# = 0.1 VDD/0.9 VDD@25 MHz,
SO = open; Single I/O
IDDR2
Read Current
—
—
10
mA
CE# = 0.1 VDD/0.9VDD@40 MHz,
SO = open
IDDR3
Read Current
—
—
12
mA
CE# = 0.1 VDD/0.9VDD@40 MHz,
SO = open; Dual I/O;
IDDW
Program and Erase Current
—
—
15
mA
CE# = VDD
ISB
Standby Current
—
50
µA
CE# = VDD, VIN =VDD or VSS
IDPD
Deep Power-Down
—
10
µA
CE# = VDD, VIN =VDD or VSS
ILI
Input Leakage Current
—
2
µA
VIN = GND to VDD, VDD =VDD Max
ILO
Output Leakage Current
2
µA
VOUT = GND to VDD,
VDD =VDD Max
VIL
Input Low Voltage
-0.3
0.3*VDD
VVDD =VDD Min
VIH
Input High Voltage
0.7*VDD
VDD+0.3
V
VDD =VDD Max
VOL
Output Low Voltage
0.2
V
IOL = 100 µA, VDD =VDD Min
VOH
Output High Voltage
VDD-0.2
V
IOH =-100µA, VDD =VDD Min
Note 1: Value characterized, not fully tested in production.
TABLE 6-6:
CAPACITANCE (TA = 25°C, F = 1 MHz, OTHER PINS OPEN)
Parameter
Description
Test Condition
Maximum
COUT(1)
Output Pin Capacitance
VOUT =0V
12pF
CIN(1)
Input Capacitance
VIN =0V
6 pF
Note 1: This parameter is measured only for initial qualification and after a design or process change that could
affect this parameter.
TABLE 6-7:
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Minimum Specification
Units
Test Method
NEND(1)
Endurance
100,000
Cycles JEDEC Standard A117
STATUS Register Write Cycle
100,000
Cycles JEDEC Standard A117
TDR(1)
Data Retention
20
Years
JEDEC Standard A103
ILTH(1)
Latch Up
100 + IDD
mA
JEDEC Standard 78
Note 1: This parameter is measured only for initial qualification and after a design or process change that could
affect this parameter.



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