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SG PARAMETER

SYMBOL

TEMP. POWER

TEST CONDITIONS

MIN

MAX

UNITS

1

Quiescent Current

I

Q

25

°C

+28Vdc

PWM Not switching

18

mA

1

ON Voltage

V

DS

25

°C

+28Vdc

I

1.8

V

1

OFF Leakage

I

DSS

25

°C

+70Vdc

Output off, V

25

µA

1

Input Voltage Threshold

V

INTH

25

°C

+28Vdc

Input increased until A

0.8

2.7

V

state

3

Quiescent Current

I

Q

–55

°C +28Vdc

PWM Not switching

18

mA

3

ON Voltage

V

DS

–55

°C +28Vdc

I

1.2

V

3

OFF Leakage

I

DSS

–55

°C +70Vdc

Output off, V

25

µA

3

Input Voltage Threshold

V

INTH

–55

°C +28Vdc

Input increased until A

0.8

2.7

V

state

2

Quiescent Current

I

Q

125

°C +28Vdc

PWM Not switching

18

mA

2

ON Voltage

V

DS

125

°C +28Vdc

I

2.4

V

2

OFF Leakage

I

DSS

125

°C +70Vdc

Output OFF, V

250

µA

2

Input Voltage Threshold

V

INTH

125

°C +28Vdc

Input increased until A

0.8

2.7

V

state

4

Operating Supply Current

I

S

25

°C

+28Vdc

PWM = 500khz TTL

60

mA

7

Disable Function

D

IS

25

°C

+28Vdc

Disable > 3.6V, PWM input=500KHz,

Pass/Fail

verify no switching

1/V

BURN IN CIRCUIT

DEVICE CELL

INPUT

DEVICE CELL

OUTPUT

DUT

NE555

1

1

2

3

4

8

7

6

5

2

3

4

R2

R1

R3

C1

C4

C5

C2

C3

+28V

+12V

–12V

–12V +12V

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MICROTECHNOLOGY

TABLE 4 GROUP A INSPECTION

SA51M

This data sheet has been carefully checked and is believed to be reliable, however, no responsibility is assumed for possible inaccuracies or omissions. All specifications are subject to change without notice.

SA51MU REV. A JANUARY 1998

© 1998 Apex Microtechnology Corp.