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STF46N60M6 Datasheet(PDF) 4 Page - STMicroelectronics |
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STF46N60M6 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 12 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD (1) Source-drain current - 36 A ISDM (2) Source-drain current (pulsed) - 126 A VSD (3) Forward on voltage ISD = 36 A, VGS = 0 V - 1.6 V trr Reverse recovery time ISD = 36 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 267 ns Qrr Reverse recovery charge - 2.8 µC IRRM Reverse recovery current - 20.8 A trr Reverse recovery time ISD = 36 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 440 ns Qrr Reverse recovery charge - 5.8 µC IRRM Reverse recovery current - 26.4 A 1. Limited by maximum junction temperature. 2. Pulse width is limited by safe operating area. 3. Pulsed: pulse duration = 300 µs, duty cycle 1.5% STF46N60M6 Electrical characteristics DS13019 - Rev 2 page 4/12 |
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