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OPA4991MDYYREP Datasheet(PDF) 21 Page - Texas Instruments

Part # OPA4991MDYYREP
Description  OPA4991-EP 40-V, Rail-to-Rail Input/Output, Low Offset Voltage, Low Noise Op Amp in Enhanced Plastic
PDF  36 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

OPA4991MDYYREP Datasheet(HTML) 21 Page - Texas Instruments

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Power-Supply
ESD Cell
100
100
VSS
VDD
IN–
IN+
+
–
R1
RS
RF
TVS
TVS
RL
VIN
+VS
–VS
ID
+
–
Figure 7-10. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
An ESD event is very short in duration and very high voltage (for example; 1 kV, 100 ns), whereas an EOS event
is long duration and lower voltage (for example; 50 V, 100 ms). The ESD diodes are designed for out-of-circuit
ESD protection (that is, during assembly, test, and storage of the device before being soldered to the PCB).
During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit
(labeled ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
www.ti.com
OPA4991-EP
SBOSAC6B – JUNE 2022 – REVISED NOVEMBER 2022
Copyright © 2022 Texas Instruments Incorporated
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Product Folder Links: OPA4991-EP



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