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ACASPROF Datasheet(PDF) 6 Page - Vishay Siliconix

Part # ACASPROF
Description  Professional Thin Film Chip Resistor Array
PDF  7 Pages
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Manufacturer  VISHAY [Vishay Siliconix]
Direct Link  http://www.vishay.com
Logo VISHAY - Vishay Siliconix

ACASPROF Datasheet(HTML) 6 Page - Vishay Siliconix

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ACAS 0612 - Professional
www.vishay.com
Vishay Beyschlag
Revision: 13-Dec-12
6
Document Number: 28754
For technical questions, contact: thinfilmarray@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
TESTS AND REQUIREMENTS
Essentially all tests are carried out in accordance with the
following specifications:
EN 60115-1, generic specification
EN 140400, sectional specification
EN 140401-801, detail specification
The testing also covers most of the requirements specified
by EIA/IS-703 and JIS-C-5202.
The tests are carried out in accordance with IEC 60068 (1)
and under standard atmospheric conditions according to
IEC 60068-1 (1)
, 5.3. Climatic category LCT/UCT/56 (rated
temperature range: Lower category temperature, upper
category temperature; damp heat, long term, 56 days) is
valid (LCT = - 55 °C/UCT = 125 °C).
Unless otherwise specified the following values apply:
Temperature: 15 °C to 35 °C
Relative humidity: 45 % to 75 %
Air pressure: 86 kPa to 106 kPa (860 mbar to 1060 mbar)
The requirements stated in the “Test Procedures and
Requirements” table are based on the required tests and
permitted limits of EN 140401-801 where applicable.
Notes
(1) The quoted IEC standards are also released as EN standards with the same number and identical contents.
(2) Figures are given for arrays with equal values, design type AE.
(3) For a single element.
TEST PROCEDURES AND REQUIREMENTS
EN
60115-1
CLAUSE
IEC
60068-2 (1)
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS
PERMISSIBLE CHANGE (2)
(
R)
Stability for product types:
ACAS 0612
47
 to 221 k
4.5
-
Resistance
-
± 1 %; ± 0.5 %
4.8.4.2
-
Temperature coefficient
At (20/- 55/20) °C and
(20/125/20) °C
± 50 ppm/K; ± 25 ppm/K
4.25.1
-
Endurance
U =
or U = Umax.;
1.5 h on; 0.5 h off;
whichever is the less severe;
70 °C; 1000 h
± (0.25 % R + 0.05
)
4.25.3
-
Endurance at upper
category temperature
125 °C; 1000 h
± (0.25 % R + 0.05
)
4.24
78 (Cab)
Damp heat,
steady state
(40 ± 2) °C; 56 days;
(93 ± 3) % RH
± (0.5 % R + 0.05
)
4.13
-
Short time overload (3)
U = 2.5 x
or
U = 2 x Umax.; 5 s
± (0.1 % R + 0.01
)
no visible damage
4.19
14 (Na)
Rapid change of
temperature
30 min at - 55 °C and
30 min at 125 °C;
5cycles
± (0.1 % R + 0.01
)
no visible damage
4.18.2
58 (Td)
Resistance to soldering
heat
Reflow method 2
(IR/forced gas convection);
(260 ± 5) °C; (10 ± 1) s
± (0.25 % R + 0.01
)
no visible damage
4.17.2
58 (Td)
Solderability
Solder bath method;
SnPb; non-activated flux
accelerated ageing 4 h/155 °C
(215 ± 3) °C; (3 ± 0.3) s
Good tinning (
 95 % covered);
no visible damage
Solder bath method;
SnAgCu; non-activated flux
accelerated ageing 4 h/155 °C
(235 ± 3) °C; (2 ± 0.2) s
4.32
21 (Ue3)
Shear (adhesion)
45 N
No visible damage
4.33
21 (Ue1)
Substrate bending
Depth 2 mm, 3 times
± (0.1 % R + 0.01
)
no visible damage;
no open circuit in bent position
4.7
-
Voltage proof
URMS = Uins
(60 ± 5) s; against ambient,
between adjacent resistors
No flashover or breakdown
P
70 x R
P
70 x R



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