74F779 datasheet(6/12 Pages) PHILIPS

6 / 12 page

Philips Semiconductors

Product specification

74F779

8-bit bidirectional binary counter (3-State)

1989 Sep 20

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

NO TAG

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONSNO TAG

MIN

TYP

NO TAG

MAX

UNIT

VCC = MIN,

VIL = MAX

IO = 1mA

±10%VCC

2.5

High level output voltage

VIL = MAX

VIH = MIN

IOH = –1mA

±5%VCC

2.7

3.4

VOH

High-level output voltage

I/On

VCC = MIN,

VIL = MAX

IO = 3mA

±10%VCC

2.4

I/On

VIL = MAX

VIH = MIN

IOH = –3mA

±5%VCC

2.7

3.3

Low level output voltage

VCC = MIN,

VIL = MAX

IO = MAX

±10%VCC

0.30

0.50

VOL

Low-level output voltage

VIL = MAX

VIH = MIN

IOL = MAX

±5%VCC

0.35

0.50

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

Input current at maximum

I/On

VCC = 5.5V, VI = 5.5V

input voltage

others

VCC = 5.5V, VI = 7.0V

100

µA

IIH

High-level input current

except

VCC = MAX, VI = 2.7V

µA

IIL

Low-level input current

I/On

VCC = MAX, VI = 0.5V

–0.6

IIH+IOZH

Off-state output current

High-level voltage applied

I/On

VCC = MAX, VO = 2.7V

µA

IIL+IOZL

Off-state output current

Low-level voltage applied

I/On

VCC = MAX, VO = 0.5V

–600

µA

IOS

Short-circuit output currentNO TAG

VCC = MAX

–60

–150

ICCH

116

ICC

Supply current (total)

ICCL

VCC = MAX

128

ICCZ

136

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

AC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

Tamb = +25°C

VCC = +5V

CL = 50pF, RL = 500Ω

Tamb = 0°C to +70°C

VCC = +5V ± 10%

CL = 50pF, RL = 500Ω

UNIT

MIN

TYP

MAX

MIN

MAX

fMAX

Maximum clock frequency

Waveform 1

125

145

115

MHz

tPLH

tPHL

Propagation delay

CP to I/On

Waveform 1

4.5

5.5

7.0

8.0

10.5

4.5

5.5

11.0

tPLH

tPHL

Propagation delay

CP to TC

Waveform 1

4.5

7.0

9.0

4.5

10.0

tPLH

tPHL

Propagation delay

CET to TC

Waveform 2

3.0

4.5

5.5

6.5

7.5

2.5

7.5

8.0

tPZH

tPZL

Output Enable time to

High or Low level

Waveform 4

Waveform 5

2.5

4.5

6.5

7.0

9.0

2.5

4.5

8.0

9.5

tPHZ

tPLZ

Output Enable time from

High or Low level

Waveform 4

Waveform 5

1.0

3.0

4.0

6.5

7.0

1.0

8.0

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