CD4030BMS

FN3305 Rev 0.00

Page 5 of 7

December 1992

FIGURE 1. 1 OF 4 IDENTICAL GATES

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

 -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

3, 4, 10, 11

1, 2, 5 - 9, 12, 13

14

Static Burn-In 2

Note 1

3, 4, 10, 11

7

1, 2, 5, 6, 8, 9,

12 - 14

Dynamic Burn-

In Note 1

-

7

14

3, 4, 10, 11

2, 6, 9, 13

1, 5, 8, 12

Irradiation

Note 2

3, 4, 10, 11

7

1, 2, 5, 6, 8, 9,

12 - 14

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

 5%, VDD = 18V  0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD

= 10V

 0.5V

Schematic Diagram

TABLE 6. APPLICABLE SUBGROUPS

(Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

B

*

2(5, 9, 12)

p

n

n

p

n

p

n

J

p

VDD

VSS

A

*

n

p

VDD

VSS

1(6, 8, 13)

p

3(4, 10, 11)

VSS

VDD

VDD

VSS

*INPUTS PROTECTED

BY CMOS PROTECTION

NETWORK

TRUTH TABLE FOR 1 OF 4

INDENTICAL GATES

AB

J

000

101

011

110

1 = High Level

0 = Low Level