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ISL73841SEHX/SAMPLE Datasheet(PDF) 8 Page - Renesas Technology Corp

Part # ISL73841SEHX/SAMPLE
Description  Radiation Tolerant 30V 32-Channel Analog Multiplexer
PDF  24 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

ISL73841SEHX/SAMPLE Datasheet(HTML) 8 Page - Renesas Technology Corp

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ISL73841SEH
FN8846 Rev 3.00
Page 8 of 24
Feb 23, 2018
Electrical Specifications (±12V) V+ = 12V, V- = -12V, V
AH = 4.0V, VAL = 0.8V, VREF = VEN = 5.0V, TA= +25°C, unless otherwise noted.
Boldface limits apply across the operating temperature range, -55°C to +125°C or across a total ionizing dose of 50krad(Si) with exposure at a low dose rate of
<10mrad(Si)/s.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 8)TYP
MAX
(Note 8)UNIT
VS
Analog Input Signal Range
V-
V+
V
rON
Channel ON-Resistance
V± = ±10.8V, ±13.2V
IOUT = -1mA, VIN = +5V, -5V
--
500
Ω
V± = ±10.8V, ±13.2V
IOUT = -1mA, VIN = V+, V-
--
700
Ω
rON
rON Match Between Channels
VIN = +5V, -5V; IOUT = -1mA
-
10
20
Ω
RFLAT(ON)
ON-Resistance Flatness
VIN = +5V, -5V, V± = ±13.2V
-
-
25
Ω
VIN = +5V, -5V, V± = ±10.8V,
TA = +25°C, -55°C, +125°C
--
30
Ω
VIN = +5V, -5V, V± = ±10.8V, post radiation
40
Ω
I+
Quiescent Supply Current
VIN = VA = VEN = 0.8V, V± = ±10.8V, ±13.2V
-
-
400
µA
I-
Quiescent Supply Current
VIN = VA = VEN = 0.8V, V± = ±10.8V, ±13.2V
-400
-
-
µA
I+
Standby Supply Current
VIN = VA = VEN = 4.0V, V± = ±10.8V, ±13.2V
-
-
400
µA
I-
Standby Supply Current
VIN = VA = VEN = 4.0V, V± = ±10.8V, ±13.2V
-400
-
-
µA
IREF
Supply Current Into VREF
VREF = 5.5V, VIN = VA = VEN = 0.8V,
V± = ±10.8V, ±13.2V
-
-
35
µA
DYNAMIC
tALH
Transition Time
Figures 5, 6
-0.5
800
ns
tAHL
Transition Time
Figures 5, 6
-0.5
800
ns
tBBM
Break-Before-Make Delay
Figures 9, 10
5
50
200
ns
Post radiation
5
-
400
ns
tENABLE
Enable Turn-On Time
Figures 7, 8
-0.5
600
ns
Post radiation
-
-
800
ns
tDISABLE
Disable Turn-Off Time
Figures 7, 8
-0.5
600
ns
Post radiation
-
-
800
ns
NOTE:
8. Compliance to datasheet limits is assured by one or more methods: production test, characterization, and/or design.



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