NE56632-29D datasheet(7/16 Pages) PHILIPS

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Philips Semiconductors

Product data

NE56632-XX

Active-LOW system reset with adjustable delay time

2002 Mar 25

TYPICAL PERFORMANCE CURVES, NE56632-31

SL01629

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

3.08

3.09

3.10

3.11

Test Circuit 1

VCC = HIGH-to-LOW

RL = 4.7 kΩ

VOL ≤ 0.4 V

S1 = ON

Figure 12. Detection threshold versus temperature.

SL01630

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

Test Circuit 1

VCC = LOW-to-HIGH

RL = 4.7 kΩ

S1 = ON

Figure 13. Hysteresis voltage versus temperature.

SL01631

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

0.17

0.18

0.19

0.20

0.21

0.22

0.23

Test Circuit 1

VCC1 = VS(min) – 0.05 V

RL = 4.7 kΩ

S1 = ON

Figure 14. LOW–level output voltage versus temperature.

SL01632

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

Test Circuit 1

VCC1 = VS(min) – 0.05 V

RL = ∞

Figure 15. Supply current (ON time) versus temperature.

SL01633

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

2.0

2.5

3.0

3.5

4.0

4.5

Test Circuit 1

RL = ∞

VCC1 = VS(typ)/0.85

Figure 16. Supply current (OFF time) versus temperature.

SL01634

AMBIENT TEMPERATURE, Tamb (°C)

–40

–20

100

0.3

0.4

0.5

0.6

0.7

0.8

0.9

Test Circuit 1

RL = 4.7 kΩ

VOL ≤ 0.4 V

S1 = ON

Figure 17. Min. operating threshold voltage versus

temperature.

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