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115S Datasheet(PDF) 3 Page - ATTEND Technology Inc.

Part # 115S
Description  Nano SIM Card Socket, Bar Push, 8u" Gold
PDF  8 Pages
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Manufacturer  ATTEND [ATTEND Technology Inc.]
Direct Link  https://www.attend.com.tw/index.php
Logo ATTEND - ATTEND Technology Inc.

115S Datasheet(HTML) 3 Page - ATTEND Technology Inc.

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The information contained herein is exclusive property of. Do not copy and print except that Attend accepts.
本文件係屬立威科技股份有限公司所有;非經同意,不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。
-3 -
Operating
Random Vibration
Without mechanical damage
and electrical discontinuity
greater then 1 μsec (s) shall
occur.
The electrical performances
should meet the spec.
specified.
Comply with method EIA-364-46B.
1. The power supply shall be capable of
supplying 100mili-amperes DC. and open
circuit voltage not to exceed 5.0 volts.
2. Mated dummy card shall be subjected
during test.
3. Vibration Profile: As following
Non-Operating
Random Vibration
Without mechanical damage.
The electrical performances
should meet the spec.
specified.
Vibration Profile: As following
Operating
Sine Vibration
Without mechanical damage
and electrical discontinuity
greater then 1 μsec (s) shall
occur.
The electrical performances
should meet the spec.
specified
Comply with method EIA-364-46B.
1. The power supply shall be capable of
supplying 100mili-amperes DC and open
circuit voltage not to exceed 5 volts.
2. Mated dummy card shall be subjected
during test.
3. Vibration Profile: As following
Operating Mechanical
Shock
No electrical discontinuity
greater than 1 μ second shall
occur.
The electrical performances
should meet the spec.
specified
Comply with method EIA-364-46B.
1. The power supply shall be capable of
supplying 100mili-amperes DC and open
circuit voltage not to exceed 5.0 volts.
2. Mated dummy card shall be subjected
during test.
3. 50G/11ms half-sine wave shock.
4. 3 shocks in each direction. Total of 6
directions.
5. Total of 18 shocks.
Non-Operating
Mechanical Shock
There is no crack,
deformation or other damage
of connector.
1. Mated dummy card shall be subjected
during test.
2. 500G/2ms half-sine wave shock.



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