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AM29LV320ML112REF Datasheet(PDF) 58 Page - Advanced Micro Devices |
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AM29LV320ML112REF Datasheet(HTML) 58 Page - Advanced Micro Devices |
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58 / 59 page ![]() 56 Am29LV320MH/L 26517B4 January 31, 2007 D A TA SH EE T REVISION SUMMARY Revision A (May 30, 2002) Initial release as Advance Information data sheet. Revision A+1 (September 3, 2002) Mirrorbit 32 Mbit Device Family Changed the 48-pin TSOP to 40-pin TSOP. Alternate CE# Controlled Erase and Program Operations Added t RH parameter to table. Erase and Program Operations Added t BUSY parameter to table. Figure 16. Program Operation Timings Added RY/BY# to waveform. TSOP and BGA PIN Capacitance Added the FBGA package. Program Suspend/Program Resume Command Sequence Changed 15 μs typical to maximum and added 5 μs typical. Erase Suspend/Erase Resume Commands Changed typical from 20 μs to 5 μs and added a maxi- mum of 20 μs. Product Selector Guide Added Note 2. Ordering Information Added 101R, 112R, and 120R to Valid Combinations Table. Added Note 1. Read-Only Operations, Erase and Program Operations, Alternate CE# Controlled Erase and Program Operations, Added 101R, 112R, and 120R to speed options. Revision A+2 (November 15, 2002) Customer Lockable: Secured Silicon Sector NOT Programmed or Protected At the Factory Added second bullet and figure. Product Selector Guide and Read-Only Operations Added 30 ns to the 112R and 120R to Max page ac- cess time and Max OE# Access time. Changed the Chip Enable to Output High Z and Out- put Enable to Output High Z to 16 ns. Byte/Word Program Command Sequence, Sector Erase Command Sequence, and Chip Erase Command Sequence Noted that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when a program or erase operation is in progress. Common Flash Memory Interface (CFI) Changed CFI website address. DC Characteristics Added I LR parameter symbol to table. Removed VIL, V IH, VOL, and VOH and replaced with VIL, VIH, VOL, VOH1 and V OH2. Clarified note #5. Removed note #6. Read-Only Operations Added note #3. Absolute Maximum Rating Changed the Ambient Temperature with Power Ap- plied from –55 °C to +125°C to –65°C to +125°C. Revision A+3 (February 14, 2003) Distinctive Characteristics Corrected performance characteristics. AC Characteristics Added Note. Input values in the t WHWH1 and tWHWH2 parameters in the Erase and Program Options table that were previ- ously TBD. Also added notes 5 and 6. Input values in the t WHWH1 and tWHWH2 parameters in the Alternate CE# Controlled Erase and Program Op- tions table that were previously TBD. Also added notes 5 and 6. Erase and Programming Performance Input values into table that were previously TBD. Added note 3 and 4. Revision B (May 7, 2003) Distinctive Characteristics Added typical active read current. Global Converted to full datasheet version. Modified Secured Silicon Sector Flash Memory Region section to in- clude ESN references. DC Characteristics Corrected typical and maximum values for the I CC1, I CC2, and ICC3. Erase and Program Operations and Alternate CE# Controlled Erase and Program Operations Changed Accelerated Effective Write Buffer Program Operation value. |
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