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SN74LVC32APWR Datasheet(PDF) 4 Page - Texas Instruments |
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SN74LVC32APWR Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 38 page ![]() 5 Specifications 5.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted)(1) MIN MAX UNIT VCC Supply voltage –0.5 6.5 V VI Input voltage(2) –0.5 6.5 V VO Output voltage(2) (3) –0.5 VCC + 0.5 V IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current ±50 mA Continuous current through VCC or GND ±100 mA Ptot Power dissipation TA = –40°C to +125°C(4) (5) 500 mW TJ Junction temperature 150 °C Tstg Storage temperature –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed. (3) The value of VCC is provided in the Recommended Operating Conditions tables. (4) For the D package: above 70°C, the value of Ptot derates linearly with 8 mW/K. (5) For the DB, DGV, NS, and PW packages: above 60°C, the value of Ptot derates linearly with 5.5 mW/K. 5.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged device model (CDM), per JEDEC specification JESD22-C101(2) ±1000 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. SN54LVC32A, SN74LVC32A SCAS286S – JANUARY 1993 – REVISED MARCH 2024 www.ti.com 4 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated Product Folder Links: SN54LVC32A SN74LVC32A |
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