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BC327 Datasheet(PDF) 1 Page - Diotec Semiconductor

Part # BC327
Description  General Purpose Si-Epitaxial Planar Transistors
PDF  2 Pages
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Manufacturer  DIOTEC [Diotec Semiconductor]
Direct Link  http://www.diotec.com
Logo DIOTEC - Diotec Semiconductor

BC327 Datasheet(HTML) 1 Page - Diotec Semiconductor

  BC327 Datasheet HTML 1Page - Diotec Semiconductor BC327 Datasheet HTML 2Page - Diotec Semiconductor  
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BC327 / BC328
BC327 / BC328
PNP
General Purpose Si-Epitaxial Planar Transistors
Si-Epitaxial Planar-Transistoren für universellen Einsatz
PNP
Version 2006-05-30
Dimensions - Maße [mm]
Power dissipation
Verlustleistung
625 mW
Plastic case
Kunststoffgehäuse
TO-92
(10D3)
Weight approx. – Gewicht ca.
0.18 g
Plastic material has UL classification 94V-0
Gehäusematerial UL94V-0 klassifiziert
Standard packaging taped in ammo pack
Standard Lieferform gegurtet in Ammo-Pack
Maximum ratings (TA = 25°C)
Grenzwerte (TA = 25°C)
BC327
BC328
Collector-Emitter-volt. – Kollektor-Emitter-Spannung E-B short
- VCES
50 V
30 V
Collector-Emitter-volt. – Kollektor-Emitter-Spannung B open
- VCEO
45 V
25 V
Emitter-Base-voltage – Emitter-Basis-Spannung
C open
- VEBO
5 V
Power dissipation – Verlustleistung
Ptot
625 mW 1)
Collector current – Kollektorstrom (dc)
- IC
800 mA
Peak Collector current – Kollektor-Spitzenstrom
- ICM
1 A
Base current – Basisstrom
- IB
100 mA
Junction temperature – Sperrschichttemperatur
Storage temperature – Lagerungstemperatur
Tj
TS
-55...+150°C
-55…+150°C
Characteristics (Tj = 25°C)
Kennwerte (Tj = 25°C)
Min.
Typ.
Max.
DC current gain – Kollektor-Basis-Stromverhältnis 2)
- VCE = 1 V, - IC = 100 mA
Group -16
Group -25
Group -40
hFE
hFE
hFE
100
160
250
160
250
400
250
400
630
- VCE = 1 V, - IC = 300 mA
Group -16
Group -25
Group -40
hFE
hFE
hFE
60
100
170
130
200
320
–
–
–
Collector-Emitter saturation voltage – Kollektor-Emitter-Sättigungsspg. 2)
- IC = 500 mA, - IB = 50 mA
- VCEsat
–
–
0.7 V
1
Valid, if leads are kept at ambient temperature at a distance of 2 mm from case
Gültig wenn die Anschlussdrähte in 2 mm Abstand vom Gehäuse auf Umgebungstemperatur gehalten werden
2
Tested with pulses tp = 300 µs, duty cycle ≤ 2% – Gemessen mit Impulsen tp = 300 µs, Schaltverhältnis ≤ 2%
© Diotec Semiconductor AG
http://www.diotec.com/
1
2 x 2.54
C BE


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