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FXLS8971CF Datasheet(PDF) 9 Page - NXP Semiconductors |
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FXLS8971CF Datasheet(HTML) 9 Page - NXP Semiconductors |
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9 / 100 page ![]() NXP Semiconductors FXLS8971CF 3-Axis Low-g Accelerometer VDD = 3.0 V, T = 25 °C , unless otherwise noted. Typical values represent mean or mean ±1 σ values, depending on the specific parameter. Symbol Parameter Conditions Min Typ Max Unit ODRMAX Maximum ODR — — 3200 — Hz XY axes — 217 — NSDHPM Noise Spectral Density, High Performance Mode, FSR ≤ ±4 g, 25 Hz ≤ ODR ≤ 3200 Hz Z axis — 257 — µg/ ⎷Hz XY axes — 7.8 — NRMSLPM Noise RMS, Low-Power Mode, FSR ≤ ±4 g, all ODR ranges[5] Z axis — 9.4 — mg Table 7. Accelerometer sensor performance parameters...continued [1] Determined with post board mount data using a standard lead-free reflow profile and NXP recommended landing pattern on a 10-layer FR4 PCB with 1.6 mm (63 mil) overall thickness. [2] Based on characterization data on limited number of parts from 3 lots. Limits provided with 4 sigma margin and 99% confidence level. [3] See Cross-axis sensitivity in Section 20 "Glossary". [4] See Self-Test in Section 20 "Glossary" [5] In low-power mode, higher ODR settings result in a lower noise density figure. 9.1 Typical performance Device typical performance characteristics are illustrated in the charts shown in Figure 4, Figure 5, and Figure 6. They represent post-board mount measurements on a three lot sample set. Offset drift is computed from the 25 °C room temperature offset. Similarly, offset and sensitivity temperature coefficients (resp. TCO and TCS) are computed with the 105 °C data or 40 °C data compared to the 25 °C data. They are referred to as TCO or TCS “Hot” (25 °C to 105 °C) and “Cold” (–40 °C to 25 °C). FXLS8971CF All information provided in this document is subject to legal disclaimers. © 2024 NXP B.V. All rights reserved. Product data sheet Rev. 2.1 — 7 March 2024 9 / 100 |
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