ISL73840SEH

FN8845 Rev.4.00

Page 8 of 23

Aug 10, 2023

Electrical Specifications (±12V) V+ =12V,V- = -12V, V

AH = 4.0V, VAL = 0.8V, VREF = VEN = 5.0V, TA= +25°C, unless otherwise noted.

Boldface limits apply across the operating temperature range, -55°C to +125°C or across a total ionizing dose of 50krad(Si) with exposure at a low dose

rate of <10mrad(Si)/s.

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

(Note 9)TYP

MAX

(Note 9)UNIT

Analog Input Signal Range

VS

V-

V+

V

Channel ON-Resistance

rON

V± = ±10.8V, ±13.2V

IOUT = -1mA, VIN = +5V, -5V, VEN = 0V

--

500

Ω

V± = ±10.8V, ±13.2V

IOUT = -1mA, VIN = V+, V-, VEN = 0V

--

700

Ω

rON Match Between Channels

ΔrON

VIN = +5V, -5V; IOUT = -1mA, VEN = 0V

-

10

20

Ω

ON-Resistance Flatness

RFLAT(ON)

VIN = +5V, -5V, V± = ±13.2V, VEN = 0V

-

-

25

Ω

VIN = +5V, -5V, V± = ±10.8V, VEN = 0V

TA = +25°C, -55°C, +125°C

--

30

Ω

VIN = +5V, -5V, V± = ±10.8V, VEN = 0V, post

radiation

--

40

Ω

Quiescent Supply Current

I+

VREF = 5.5V, VIN = 0V, VA = 0.8V, VEN = 0.8V,

V± = ±10.8V, ±13.2V

--

350

µA

I-

VREF = 5.5V, VIN = 0V, VA = 0.8V, VEN = 0.8V,

V± = ±10.8V, ±13.2V

-350

--

µA

Standby Supply Current

I+

VREF = 5.5V, VIN = 0V, VA = 0.8V, VEN = 4.0V,

V± = ±10.8V, ±13.2V

--

350

µA

I-

VREF = 5.5V, VIN = 0V, VA = 0.8V, VEN = 4.0V,

V± = ±10.8V, ±13.2V

-350

--

µA

Quiescent Supply Current Into VREF

IREF

VREF = 5.5V, VIN = 0V, VA = 0.8V, VEN = 0.8V,

V± = ±10.8V, ±13.2V

--

35

µA

Standby Current Into VREF

IREF(STBY)

VREF = 5.5V, VIN = 0V, VA = 0.8V, VEN = 4.0V,

V± = ±10.8V, ±13.2V

--

35

µA

DYNAMIC

tALH

Transition Time

Figures 5, 6

-0.5

800

ns

tAHL

Figures 5, 6

-0.5

800

ns

tBBM

Break-Before-

Make Delay

Figures 9, 10

5

50

200

ns

Post radiation

-

-

400

ns

tENABLE

Enable Turn-On

Time

Figures 7, 8

-0.5

600

ns

Post radiation

-

-

800

ns

tDISABLE

Disable Turn-Off

Time

Figures 7, 8

-0.5

600

ns

Post radiation

-

-

800

ns

NOTE:

9. Compliance to datasheet limits is assured by one or more methods: production test, characterization, and/or design.