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ADUM1253 Datasheet(PDF) 21 Page - Analog Devices

Part # ADUM1253
Description  Ultra-Low-Power, I2C Isolator with Unidirectional SCL, Extended VDD, Idle-Bus Hot-Swap, and Low VOL
PDF  24 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADUM1253 Datasheet(HTML) 21 Page - Analog Devices

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ADuM1253
Ultra-Low-Power, I2C Isolator with
Unidirectional SCL, Extended VDD,
Idle-Bus Hot-Swap, and Low VOL
www.analog.com
Analog Devices | 21
125µs
FILTER
STOP DETECT
SDA
SCL
IDLE
STOP
200ns
GLITCH
FILTER
200ns
GLITCH
FILTER
SIDE1
HIGH
SIGNAL
S
R
Q
SIDE 1 OFF
RST
CON
PRECHARGE
SDA2
CON
SCL2
CON
0.45VDD2
RST
SDA2/SCL2
SIDE 1 BUS STUCK
0.38VDD2
VDD2
0.45VDD2
1/3 VDD2
PRECHARGE
1/3 VDD2
Figure 7. Bus Connection Logic
Bus Connection
The ADuM1253 connects the side 1 bus to the side 2 bus when both busses are idle or when side 1 is high and an I2C
stop condition has been detected on side 2. If a stuck bus condition is detected on side 1, then the ADuM1253 disconnects
the two busses to allow the external system to attempt a recovery.
Applications Information
Power-Supply Sequencing
The ADuM1253 does not require special power-supply sequencing. The logic levels are set independently on either side
by VDD1 and VDD2. Each supply can be present over the entire specified range regardless of the level or presence of the
other supply.
Power-Supply Decoupling
To reduce ripple and the chance of introducing data errors especially if large common-mode transients are expected in
the application, bypass VDD1 and VDD2 with 100nF and 1nF low-ESR ceramic capacitors to GND1 and GND2,
respectively. Place the bypass capacitors as close to the power-supply input pins as possible.
Thermal Considerations
Thermal performance is directly linked to printed circuit board (PCB) design and operating environment. Pay careful
attention to the PCB thermal design.
Thermal parameter values are specified in the Package Information section. θJA and θJB are mainly used to compare the
thermal performance of the package of the device with other semiconductor packages when all test conditions listed are
similar. ΨJB r ΨJT can be used to estimate the junction temperature when an accurate thermal measurement of the
board temperature is available. The temperature measurement must be near the device under test (DUT) or directly on
the package top surface, operating in the system environment.
θJA can be used for a first-order approximation to calculate the junction temperature in the system environment. The
power dissipation (PD), junction-to-ambient thermal impedance (θJA), and ambient temperature (TA) determine the
junction temperature (TJ) according to the expression:
TJ = TA + (PD x ������JA)



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