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DRIVER SECTION

Electrical Characteristics

(1)

Switching Characteristics

(1)

MAX3221-EP

3-V TO 5.5-V SINGLE-CHANNEL RS-232 LINE DRIVER/RECEIVER

WITH

±15-kV ESD PROTECTION

SLLS751 – OCTOBER 2006

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 6)

PARAMETER

TEST CONDITIONS

MIN

TYP(2)

MAX

UNIT

VOH

High-level output voltage

DOUT at RL = 3 kΩ to GND, DIN = GND

5

5.4

V

VOL

Low-level output voltage

DOUT at RL = 3 kΩ to GND, DIN = VCC

–5

–5.4

V

IIH

High-level input current

VI = VCC

±0.01

±1

µA

IIL

Low-level input current

VI = GND

±0.01

±1

µA

VCC = 3.6 V, VO = 0 V

±35

±60

Short-circuit output

IOS

mA

current(3)

VCC = 5.5 V, VO = 0 V

±35

±60

ro

Output resistance

VCC, V+, and V– = 0 V, VO = ±2 V

300

10M

Ω

VO = ±12 V, VCC = 3 V to 3.6 V

±25

Ioff

Output leakage current

FORCEOFF = GND

µA

VO = ±10 V, VCC = 4.5 V to 5.5 V

±25

(1)

Test conditions are C1–C4 = 0.1

µF at V

CC = 3.3 V ± 0.3 V; C1 = 0.047 µF, C2–C4 = 0.33 µF at VCC = 5 V ± 0.5 V.

(2)

All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

(3)

Short-circuit durations should be controlled to prevent exceeding the device absolute power dissipation ratings, and not more than one

output should be shorted at a time.

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 6)

PARAMETER

TEST CONDITIONS

MIN

TYP(2)

MAX

UNIT

Maximum data rate

CL = 1000 pF,

RL = 3 kΩ,

See Figure 1

150

250

kbit/s

tsk(p)

Pulse skew(3)

CL = 150 pF to 2500 pF,

RL = 3 kΩ to 7 kΩ,

See Figure 2

100

ns

Slew rate, transition

VCC = 3.3 V,

SR(tr)

CL = 150 pF to 1000 pF

6

30

V/

µs

region (see Figure 1)

RL = 3 kΩ to 7 kΩ

(1)

Test conditions are C1–C4 = 0.1

µF at V

CC = 3.3 V ± 0.3 V; C1 = 0.047 µF, C2–C4 = 0.33 µF at VCC = 5 V ± 0.5 V.

(2)

All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.

(3)

Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.

ESD Protection

TERMINAL

TEST CONDITIONS

TYP

UNIT

NAME

NO.

DOUT

13

Human-Body Model (HBM)

±15

kV

4

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